Asen Asenov - RankMe

89 papers A* 1A 4B 1C 6Journal 44Unranked 33

Year	Rank	Type	Title / Venue / Authors
2026	J	`jnl`	NFGen: Normalizing Flow-Based Joint Generative Model for Variability-Aware Design Technology Co-Optimization. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Tao Zou, Zhenxing Dou, Zhiwei Chen, Yijiao Wang, Wen Shi, Zhiyu Wang, Peng Wang, Runsheng Wang, Weisheng Zhao, Asen Asenov
2025	J	`jnl`	A Methodology for Process Design Kit Re-Centering Using TCAD and Experimental Data for Cryogenic Temperatures. CoRR Tapas Dutta, Fikru Adamu-Lema, Djamel Bensouiah, Asen Asenov
2023	J	`jnl`	Fully Convolutional Generative Machine Learning Method for Accelerating Non-Equilibrium Greens Function Simulations. CoRR Preslav Aleksandrov, Ali Rezaei, Nikolas Xeni, Tapas Dutta, Asen Asenov, Vihar P. Georgiev
2022	J	`jnl`	Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation - Part I: CNFET Transistor Optimization. IEEE Trans. Very Large Scale Integr. Syst. Rongmei Chen, Lin Chen, Jie Liang, Yuanqing Cheng, Souhir Elloumi, Jaehyun Lee, Kangwei Xu, Vihar P. Georgiev, Kai Ni, Peter Debacker, Asen Asenov, Aida Todri-Sanial
2022	J	`jnl`	Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation - Part II: CNT Interconnect Optimization. IEEE Trans. Very Large Scale Integr. Syst. Rongmei Chen, Lin Chen, Jie Liang, Yuanqing Cheng, Souhir Elloumi, Jaehyun Lee, Kangwei Xu, Vihar P. Georgiev, Kai Ni, Peter Debacker, Asen Asenov, Aida Todri-Sanial
2021	—	`conf`	TCAD Simulation of Novel Semiconductor Devices. ASICON Tapas Dutta, Cristina Medina-Bailon, Ali Rezaei, Daniel Nagy, Fikru Adamu-Lema, Nikolas Xeni, Yassine Abourrig, Naveen Kumar, Vihar P. Georgiev, Asen Asenov
2019	—	`conf`	Advanced Simulation of RRAM Memory Cells. ASICON Toufik Sadi, Oves Badami, Vihar P. Georgiev, Jie Ding, Asen Asenov
2019	—	`conf`	Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs. LSSC Toufik Sadi, Oves Badami, Vihar P. Georgiev, Asen Asenov
2019	—	`conf`	Techniques for Statistical Enhancement in a 2D Multi-subband Ensemble Monte Carlo Nanodevice Simulator. LSSC Cristina Medina-Bailon, Carlos Sampedro, José Luis Padilla, Luca Donetti, Vihar P. Georgiev, Francisco Gámiz, Asen Asenov
2019	—	`conf`	The First International Competition in Machine Reconnaissance Blind Chess. NeurIPS (Competition and Demos) Ryan W. Gardner, Corey Lowman, Casey Richardson, Ashley J. Llorens, Jared Markowitz, Nathan Drenkow, Andrew Newman, Gregory Clark, Gino Perrotta, Robert Perrotta, Timothy Highley, Vlad Shcherbina, William Bernadoni, Mark Jordan, Asen Asenov
2018	—	`conf`	Automatic Segmentation of Lumbar Spine MRI Using Ensemble of 2D Algorithms. CSI@MICCAI Nedelcho Georgiev, Asen Asenov
2018	—	`conf`	Impact of the Trap Attributes on the Gate Leakage Mechanisms in a 2D MS-EMC Nanodevice Simulator. NMA Cristina Medina-Bailon, Toufik Sadi, Carlos Sampedro, José Luis Padilla, Luca Donetti, Vihar P. Georgiev, Francisco Gámiz, Asen Asenov
2018	—	`conf`	Microscopic KMC Modeling of Oxide RRAMs. NMA Toufik Sadi, Asen Asenov
2018	A	`conf`	Progress on carbon nanotube BEOL interconnects. DATE Benjamin Uhlig, Jie Liang, Jaehyun Lee, Raphael Ramos, Abitha Dhavamani, Nicole Nagy, Jean Dijon, Hanako Okuno, Dipankar Kalita, Vihar P. Georgiev, Asen Asenov, Salvatore M. Amoroso, Liping Wang, Campbell Millar, F. Konemann, Bernd Gotsmann, Goncalo Goncalves, Bingan Chen, Reeturaj Pandey, R. Chen, Aida Todri-Sanial
2018	J	`jnl`	Stochastic analysis of surface roughness models in quantum wires. Comput. Phys. Commun. Mihail Nedjalkov, Paul Ellinghaus, Josef Weinbub, Toufik Sadi, Asen Asenov, Ivan Dimov, Siegfried Selberherr
2017	J	`jnl`	Software Server for Automatic Generation of Audio Lectures (uListenSrv). Int. J. Adv. Corp. Learn. Milen Petrov, Asen Asenov, Adelina Aleksieva-Petrova
2017	—	`conf`	TCAD based Design-Technology Co-Optimisations in advanced technology nodes. VLSI-DAT Asen Asenov, Karim El Sayed, Ricardo Borges, Plamen Asenov, Campbell Millar, Terry Ma
2016	J	`jnl`	Editorial. Microelectron. Reliab. Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
2016	—	`conf`	Multi-scale electrothermal simulation and modelling of resistive random access memory devices. PATMOS Toufik Sadi, Liping Wang, Asen Asenov
2016	J	`jnl`	Multivariate Modeling of Variability Supporting Non-Gaussian and Correlated Parameters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. André Lange, Christoph Sohrmann, Roland Jancke, Joachim Haase, Binjie Cheng, Asen Asenov, Ulf Schlichtmann
2015	—	`conf`	Circuit design perspectives for Ge FinFET at 10nm and beyond. ISQED Saurabh Sinha, Lucian Shifren, Vikas Chandra, Brian Cline, Greg Yeric, Robert C. Aitken, Bingjie Cheng, Andrew R. Brown, Craig Riddet, C. Alexandar, Campbell Millar, Asen Asenov
2015	—	`conf`	Experimental evidences and simulations of trap generation along a percolation path. ESSDERC Louis Gerrer, Razaidi Hussin, Salvatore M. Amoroso, Jacopo Franco, Pieter Weckx, Marko Simicic, N. Horiguchi, Ben Kaczer, Tibor Grasser, Asen Asenov
2015	J	`jnl`	Mastering CMOS variability is the key to success. IET Comput. Digit. Tech. Asen Asenov
2015	—	`conf`	Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. ESSDERC Razaidi Hussin, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marko Simicic, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov
2014	—	`conf`	Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability. ESSDERC Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Asen Asenov
2014	—	`conf`	FDSOI molecular flash cell with reduced variability for low power flash applications. ESSDERC Vihar P. Georgiev, Salvatore M. Amoroso, Laia Vila-Nadal, Cristoph Busche, Leroy Cronin, Asen Asenov
2014	B	`conf`	Factoring variability in the Design/Technology Co Optimisation (DTCO) in advanced CMOS. ETS Asen Asenov
2014	—	`conf`	Multi-scale Computational Framework for Evaluating of the Performance of Molecular Based Flash Cells. NMA Vihar P. Georgiev, Asen Asenov
2014	J	`jnl`	RTN distribution comparison for bulk, FDSOI and FinFETs devices. Microelectron. Reliab. Louis Gerrer, Salvatore M. Amoroso, Razaidi Hussin, Asen Asenov
2014	J	`jnl`	Special section reliability and variability of devices for circuits and systems. Microelectron. Reliab. Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
2013	J	`jnl`	Analytical Models for Three-Dimensional Ion Implantation Profiles in FinFETs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Liping Wang, Andrew R. Brown, Binjie Cheng, Asen Asenov
2013	—	`conf`	Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models. ICICDT Plamen Asenov, David New, Dave Reid, Campbell Millar, Scott Roy, Asen Asenov
2013	J	`jnl`	Impact of statistical parameter set selection on the statistical compact model accuracy: BSIM4 and PSP case study. Microelectron. J. Negin Moezi, Daryoosh Dideban, Binjie Cheng, Scott Roy, Asen Asenov
2013	—	`conf`	Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability. ESSDERC Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Jente B. Kuang, Sani R. Nassif, Asen Asenov
2013	—	`conf`	Investigation of SRAM using BTI-aware statistical compact models. ESSDERC Jie Ding, Dave Reid, Campbell Millar, Asen Asenov
2013	—	`conf`	Multi-scale computational framework for the evaluation of variability in the programing window of a flash cell with molecular storage. ESSDERC Vihar P. Georgiev, Stanislav Markov, Laia Vila-Nadal, Cristoph Busche, Leroy Cronin, Asen Asenov
2013	A*	`conf`	Predicting future technology performance. DAC Asen Asenov, Craig Alexander, Craig Riddet, Ewan Towie
2013	C	`conf`	SRAM device and cell co-design considerations in a 14nm SOI FinFET technology. ISCAS Binjie Cheng, Xingsheng Wang, Andrew R. Brown, Jente B. Kuang, Dave Reid, Campbell Millar, Sani R. Nassif, Asen Asenov
2013	J	`jnl`	Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology. IEEE Des. Test Xingsheng Wang, Binjie Cheng, Jente B. Kuang, Andrew R. Brown, Campbell Millar, Asen Asenov
2012	C	`conf`	A framework to study time-dependent variability in circuits at sub-35nm technology nodes. ISCAS Tong Boon Tang, Alan F. Murray, Binjie Cheng, Asen Asenov
2012	J	`jnl`	Accurate capturing of the statistical aspect of NBTI/PBTI variability into statistical compact models. Microelectron. J. Muhammad Faiz Bukhori, Noor Ain Kamsani, Asen Asenov, Nazrul Anuar Nayan
2012	—	`conf`	An advanced statistical compact model strategy for SRAM simulation at reduced VDD. ESSDERC Plamen Asenov, Dave Reid, Scott Roy, Campbell Millar, Asen Asenov
2012	—	`conf`	Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation. ESSDERC Salvatore M. Amoroso, Louis Gerrer, Stanislav Markov, Fikru Adamu-Lema, Asen Asenov
2012	J	`jnl`	ICMAT 2011 - Reliability and variability of semiconductor devices and ICs. Microelectron. Reliab. Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
2012	J	`jnl`	Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs. Microelectron. Reliab. Louis Gerrer, Stanislav Markov, Salvatore M. Amoroso, Fikru Adamu-Lema, Asen Asenov
2012	—	`conf`	Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design. ESSDERC Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Asen Asenov
2011	J	`jnl`	Implementation of the Density Gradient Quantum Corrections for 3-D Simulations of Multigate Nanoscaled Transistors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Antonio J. García-Loureiro, Natalia Seoane, Manuel Aldegunde, Raúl Valín Ferreiro, Asen Asenov, Antonio Martinez, Karol Kalna
2011	A	`conf`	Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis. DATE Michael Merrett, Plamen Asenov, Yangang Wang, Mark Zwolinski, Dave Reid, Campbell Millar, Scott Roy, Zhenyu Liu, Stephen B. Furber, Asen Asenov
2011	A	`conf`	Statistical aspects of NBTI/PBTI and impact on SRAM yield. DATE Asen Asenov, Andrew R. Brown, Binjie Cheng
2011	J	`jnl`	The evolution of standard cell libraries for future technology nodes. Genet. Program. Evolvable Mach. James Alfred Walker, James A. Hilder, Dave Reid, Asen Asenov, Scott Roy, Campbell Millar, Andy M. Tyrrell
2010	—	`conf`	Advanced Monte Carlo Techniques in the Simulation of CMOS Devices and Circuits. NMA Asen Asenov
2010	A	`conf`	Capturing intrinsic parameter fluctuations using the PSP compact model. DATE Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov
2010	J	`jnl`	Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures. Microelectron. Reliab. Brahim Benbakhti, J. S. Ayubi-Moak, Karol Kalna, D. Lin, Geert Hellings, Guy Brammertz, Kristin De Meyer, Iain Thayne, Asen Asenov
2010	—	`conf`	Modeling and simulation of transistor and circuit variability and reliability. CICC Asen Asenov, Binjie Cheng, Daryoosh Dideban, Urban Kovac, Negin Moezi, Campbell Millar, Gareth Roy, Andrew R. Brown, Scott Roy
2010	C	`conf`	Statistical NBTI-effect prediction for ULSI circuits. ISCAS Tong Boon Tang, Alan F. Murray, Binjie Cheng, Asen Asenov
2010	J	`jnl`	Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP. IEEE Des. Test Comput. Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov
2009	—	`conf`	Enabling Cutting-Edge Semiconductor Simulation through Grid Technology. LSSC Asen Asenov, Dave Reid, Campbell Millar, Scott Roy, Gareth Roy, Richard O. Sinnott, Gordon Stewart, Graeme Robert Stewart
2009	C	`conf`	Impact of Random Dopant Induced Statistical Variability on Inverter Switching Trajectories and Timing Variability. ISCAS Noor Ain Kamsani, Binjie Cheng, Scott Roy, Asen Asenov
2008	C	`conf`	Integrating Security Solutions to Support nanoCMOS Electronics Research. ISPA Richard O. Sinnott, Christopher Bayliss, Thomas Doherty, David B. Martin, Campbell Millar, Gordon Stewart, John P. Watt, Asen Asenov, Gareth Roy, Scott Roy, C. Davenhall, Bruno Harbulot, M. Jones
2008	—	`conf`	Secure, Performance-Oriented Data Management for nanoCMOS Electronics. eScience Richard O. Sinnott, Christopher Bayliss, C. Davenhall, Bruno Harbulot, Mike Jones, Campbell Millar, Gareth Roy, Scott Roy, Gordon Stewart, John P. Watt, Asen Asenov
2008	J	`jnl`	Statistical aspects of reliability in bulk MOSFETs with multiple defect states and random discrete dopants. Microelectron. Reliab. Muhammad Faiz Bukhori, Scott Roy, Asen Asenov
2008	J	`jnl`	Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET. Microelectron. Reliab. Urban Kovac, Dave Reid, Campbell Millar, Gareth Roy, Scott Roy, Asen Asenov
2008	J	`jnl`	Supercomputing at Work in the nanoCMOS Electronics Domain. ERCIM News Richard O. Sinnott, Campbell Millar, Asen Asenov
2007	C	`conf`	Statistical Device Variability and its Impact on Yield and Performance. IOLTS Asen Asenov
2007	—	`conf`	Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics. eScience Liangxiu Han, Asen Asenov, Dave Berry, Campbell Millar, Gareth Roy, Scott Roy, Richard O. Sinnott, Gordon Stewart
2005	—	`conf`	A High-Performance Parallel Device Simulator for High Electron Mobility Transistors. PARCO Natalia Seoane, Antonio J. García-Loureiro, Karol Kalna, Asen Asenov
2004	J	`jnl`	Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs. Microelectron. Reliab. L. Yang, Asen Asenov, Jeremy R. Watling, M. Boriçi, John R. Barker, Scott Roy, K. Elgaid, Iain Thayne, T. Hackbarth
2004	—	`conf`	The impact of random doping effects on CMOS SRAM cell. ESSCIRC Binjie Cheng, Scott Roy, Asen Asenov
2003	J	`jnl`	Nonequilibrium and ballistic transport, and backscattering in decanano HEMTs: a Monte Carlo simulation study. Math. Comput. Simul. Karol Kalna, Asen Asenov
2001	J	`jnl`	IWCE-7 Committees. VLSI Design John R. Barker, Asen Asenov
2001	J	`jnl`	Non-Equilibrium Hole Transport in Deep Sub-Micron Well-Tempered Si VLSI Design Jeremy R. Watling, Yan P. Zhao, Asen Asenov, John R. Barker
2001	J	`jnl`	Quantum Corrections to the 'Atomistic' MOSFET Simulations. VLSI Design Asen Asenov, Gabriela Slavcheva, Savas Kaya, R. Balasubramaniam
2001	J	`jnl`	Scaling of pHEMTs to Decanano Dimensions. VLSI Design Karol Kalna, Asen Asenov, K. Elgaid, Iain Thayne
2001	J	`jnl`	Soft Sphere Model for Electron Correlation and Scattering in the Atomistic Modelling of Semiconductor Devices. VLSI Design Jeremy R. Watling, John R. Barker, Asen Asenov
1999	J	`jnl`	Hierarchical approach to "atomistic" 3-D MOSFET simulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Asen Asenov, Andrew R. Brown, John H. Davies, Subhash Saini
1998	J	`jnl`	3D Parallel Finite Element Simulation of In-Cell Breakdown in Lateral-Channel IGBTs. VLSI Design Andrew R. Brown, Asen Asenov, John R. Barker
1998	J	`jnl`	A New Approach based on Brownian Motion for the Simulation of Ultra-Small Semiconductor Devices. VLSI Design Clinton R. Arokianathan, Asen Asenov, John H. Davies
1998	J	`jnl`	Ab-initio Coulomb Scattering in Atomistic Device Simulation. VLSI Design Clinton R. Arokianathan, John H. Davies, Asen Asenov
1998	J	`jnl`	Complete RF Analysis of Compound FETs Based on Transient Monte Carlo Simulation. VLSI Design S. Babiker, Asen Asenov, Norman Cameron, S. P. Beaumont, John R. Barker
1998	J	`jnl`	Monte Carlo Calibrated Drift-Diffusion Simulation of Short Channel HFETs. VLSI Design Asen Asenov, S. Babiker, S. P. Beaumont, John R. Barker
1998	J	`jnl`	Quadrilateral Finite Element Monte Carlo Simulation of Complex Shape Compound FETs. VLSI Design S. Babiker, Asen Asenov, John R. Barker, S. P. Beaumont
1998	J	`jnl`	RF Performance of Si/SiGe MODFETs: A Simulation Study. VLSI Design Sumit Roy, Asen Asenov, S. Babiker, John R. Barker, S. P. Beaumont
1998	J	`jnl`	Topologically Rectangular Grids in the Parallel Simulation of Semiconductor Devices. VLSI Design Asen Asenov, Andrew R. Brown, Scott Roy, John R. Barker
1996	—	`conf`	Optimum partitioning of topologically rectangular grids. EUROSIM Scott Roy, Asen Asenov, John R. Barker
1996	J	`jnl`	Scalable parallel 3D finite element nonlinear Poisson solver. Simul. Pract. Theory Asen Asenov, John R. Barker, Andrew R. Brown, G. L. Lee
1995	J	`jnl`	Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers. Parallel Comput. Asen Asenov, Dave Reid, John R. Barker
1994	—	`conf`	Parallel Simulation of Semiconductor Devices. EUROSIM John R. Barker, Asen Asenov, Andrew R. Brown, J. Cluckie, S. Babiker, Clinton R. Arokianathan
1994	—	`conf`	Scalable Parallel 3D Finite Element Nonlinear Poisson Solver. EUROSIM Asen Asenov, John R. Barker, Andrew R. Brown, G. L. Lee
1994	J	`jnl`	Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers. Parallel Comput. Asen Asenov, Dave Reid, John R. Barker