Arun Gunda

15 papers A 5B 1C 1Misc 1Journal 2Unranked 5
YearRankTypeTitle / Venue / Authors
2014 — conf
Silicon Evaluation of Cell-Aware ATPG Tests and Small Delay Tests.
ATS
Fan Yang, Sreejit Chakravarty, Arun Gunda, Nicole Wu, Jianyu Ning
2012 Misc conf
Silicon evaluation of faster than at-speed transition delay tests.
VTS
Sreejit Chakravarty, Narendra Devta-Prasanna, Arun Gunda, Junxia Ma, Fan Yang, H. Guo, R. Lai, D. Li
2010 A conf
Clock Gate Test Points.
ITC
Narendra Devta-Prasanna, Arun Gunda
2010 A conf
Multiple fault activation cycle tests for transistor stuck-open faults.
ITC
Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz
2009 A conf
Accurate measurement of small delay defect coverage of test patterns.
ITC
Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy
2008 J jnl
Comparative study of centralised and distributed compatibility-based test data compression.
IET Comput. Digit. Tech.
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
2007 J jnl
Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda
2007 — conf
Systematic Scan Reconfiguration.
ASP-DAC
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
2006 B conf
A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults.
ETS
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2006 — conf
Test Generation for Open Defects in CMOS Circuits.
DFT
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2005 C conf
A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals.
ICCD
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2005 — conf
Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions.
Asian Test Symposium
Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz
2005 A conf
Methods for improving transition delay fault coverage using broadside tests.
ITC
Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz
2005 — conf
Should Illinois-Scan Based Architectures be Centralized or Distributed?
DFT
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
1995 A conf
Failure Analysis for Full-Scan Circuits.
ITC
Kaushik De, Arun Gunda