Arturo J. Fernández

36 papers Journal 36
YearRankTypeTitle / Venue / Authors
2026 J jnl
Minimax truncated repetitive Weibull reliability demonstration test planning.
Comput. Ind. Eng.
Arturo J. Fernández
2025 J jnl
Bayesian credible regions for two-parameter exponential distributions under type-II censoring.
J. Comput. Appl. Math.
Ali Saadati Nik, Akbar Asgharzadeh, Arturo J. Fernández
2025 J jnl
Computation of minimum-size confidence sets for one and two Weibull reliability levels.
Comput. Ind. Eng.
Arturo J. Fernández
2023 J jnl
Optimal Confidence Regions for Weibull Parameters and Quantiles under Progressive Censoring.
Algorithms
Arturo J. Fernández
2023 J jnl
Optimal repetitive reliability inspection of manufactured lots for lifetime models using prior information.
Int. J. Prod. Res.
Carlos J. Pérez-González, Arturo J. Fernández, Vicent Giner-Bosch, Andrés Carrión-García
2023 J jnl
Optimum lot inspection based on lognormal reliability tests.
Int. J. Prod. Res.
Arturo J. Fernández
2023 J jnl
Overdispersion Effects on Reliability Test Planning.
IEEE Trans. Reliab.
Arturo J. Fernández, Carlos J. Pérez-González, Andrés Carrión-García, Vicent Giner-Bosch
2023 J jnl
Tolerance Limits and Sample-Size Determination Using Weibull Trimmed Data.
Axioms
Arturo J. Fernández
2022 J jnl
Enhanced Lot Acceptance Testing Based on Defect Counts and Posterior Odds Ratios.
Axioms
Arturo J. Fernández
2022 J jnl
Gamma Reliability Test Times With Minimal Costs and Limited Risks.
IEEE Trans. Reliab.
Arturo J. Fernández
2022 J jnl
Joint Prediction for Future Failures Times Under Type-II Censoring.
IEEE Trans. Reliab.
S. F. Bagheri, Akbar Asgharzadeh, Arturo J. Fernández, Carlos J. Pérez-González
2022 J jnl
Planning reliability demonstration tests with limited expected risks.
Comput. Ind. Eng.
Arturo J. Fernández
2021 J jnl
Optimal durations of Weibull reliability tests based on failure counts.
Comput. Ind. Eng.
Arturo J. Fernández
2021 J jnl
Optimal lot sentencing based on defective counts and prior acceptability.
J. Comput. Appl. Math.
Arturo J. Fernández, Carlos J. Pérez-González, M. Mercedes Suárez-Rancel
2020 J jnl
Balancing producer and consumer risks in optimal attribute testing: A unified Bayesian/Frequentist design.
Eur. J. Oper. Res.
Arturo J. Fernández, Cristian D. Correa-Álvarez, Luis R. Pericchi
2020 J jnl
Efficient truncated repetitive lot inspection using Poisson defect counts and prior information.
Eur. J. Oper. Res.
Carlos J. Pérez-González, Arturo J. Fernández, Akram Kohansal
2020 J jnl
Explicit lot inspection by attributes using minimal prior information.
Comput. Ind. Eng.
Arturo J. Fernández
2019 J jnl
Improved time-censored reliability test plans for k-out-of-n gamma systems.
J. Comput. Appl. Math.
Arturo J. Fernández, Carlos J. Pérez-González, Akram Kohansal
2019 J jnl
Optimal attribute sampling plans in closed-forms.
Comput. Ind. Eng.
Arturo J. Fernández
2017 J jnl
Economic lot sampling inspection from defect counts with minimum conditional value-at-risk.
Eur. J. Oper. Res.
Arturo J. Fernández
2015 J jnl
Optimal schemes for resubmitted lot acceptance using previous defect count data.
Comput. Ind. Eng.
Arturo J. Fernández
2015 J jnl
Optimum attributes component test plans for k-out-of-n: F Weibull systems using prior information.
Eur. J. Oper. Res.
Arturo J. Fernández
2014 J jnl
Computing optimal confidence sets for Pareto models under progressive censoring.
J. Comput. Appl. Math.
Arturo J. Fernández
2014 J jnl
Optimal Defects-Per-Unit Acceptance Sampling Plans Using Truncated Prior Distributions.
IEEE Trans. Reliab.
Arturo J. Fernández
2013 J jnl
Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis.
Comput. Stat.
Carlos J. Pérez-González, Arturo J. Fernández
2013 J jnl
Smallest Pareto confidence regions and applications.
Comput. Stat. Data Anal.
Arturo J. Fernández
2012 J jnl
Generalized beta prior models on fraction defective in reliability test planning.
J. Comput. Appl. Math.
Arturo J. Fernández, Carlos J. Pérez-González
2012 J jnl
Minimizing the area of a Pareto confidence region.
Eur. J. Oper. Res.
Arturo J. Fernández
2012 J jnl
Optimal acceptance sampling plans for log-location-scale lifetime models using average risks.
Comput. Stat. Data Anal.
Arturo J. Fernández, Carlos J. Pérez-González
2011 J jnl
Design of progressively censored group sampling plans for Weibull distributions: An optimization problem.
Eur. J. Oper. Res.
Arturo J. Fernández, Carlos J. Pérez-González, Muhammad Aslam, Chi-Hyuck Jun
2011 J jnl
Optimal Reliability Demonstration Test Plans for $k$-out-of-$n$ Systems of Gamma Distributed Components.
IEEE Trans. Reliab.
Arturo J. Fernández
2010 J jnl
Tolerance Limits for k -Out-of- n Systems With Exponentially Distributed Component Lifetimes.
IEEE Trans. Reliab.
Arturo J. Fernández
2010 J jnl
Two-sided tolerance intervals in the exponential case: Corrigenda and generalizations.
Comput. Stat. Data Anal.
Arturo J. Fernández
2008 J jnl
Reliability inference and sample-size determination under double censoring for some two-parameter models.
Comput. Stat. Data Anal.
Arturo J. Fernández
2006 J jnl
Bayesian estimation based on trimmed samples from Pareto populations.
Comput. Stat. Data Anal.
Arturo J. Fernández
2006 J jnl
Bounding maximum likelihood estimates based on incomplete ordered data.
Comput. Stat. Data Anal.
Arturo J. Fernández