Artur Pogiel

25 papers A 6B 7C 1Misc 2Journal 7Unranked 2
YearRankTypeTitle / Venue / Authors
2025 B conf
Holistic Memory DFT Partitioning Using a Convolution-Based Algorithm.
ETS
Olivier Romain, Wojciech Gierszal, Luc Romain, Artur Pogiel
2025 Misc conf
Periodic Non-Destructive Memory BIST for Automotive Applications.
VTS
Wei Zou, Artur Pogiel, Albert Au, Martin Keim
2024 A conf
Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies.
ITC
Jaehoon Lee, HyeonUk Son, Seohyun Kang, Dahyun Kang, Dongkwan Han, Jongsin Yun, Artur Pogiel, Etienne Racine, Krzysztof Jurga, Lori Schramm, Martin Keim
2024 A conf
Power-Aware Test Scheduling for Memory BIST.
ITC
Albert Au, Michal Kçpinski, Makary Orczyk, Artur Pogiel
2022 J jnl
LBIST for Automotive ICs With Enhanced Test Generation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer
2021 B conf
Convolutional Compaction-Based MRAM Fault Diagnosis.
ETS
Bartosz Grzelak, Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2017 B conf
ROM fault diagnosis for O(n
ETS
Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2014 — conf
High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs.
ATS
Maciej Trawka, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jakub Janicki, Jerzy Tyszer
2014 C conf
Quality assurance in memory built-in self-test tools.
DDECS
Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada
2011 J jnl
BIST-Based Fault Diagnosis for Read-Only Memories.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2011 B conf
Diagnosis of Failing Scan Cells through Orthogonal Response Compaction.
ETS
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2011 — conf
Fault Diagnosis in Memory BIST Environment with Non-march Tests.
Asian Test Symposium
Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek
2011 J jnl
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs.
J. Electron. Test.
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2011 J jnl
Ring Generator: An Ultimate Linear Feedback Shift Register.
Computer
Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer
2010 B conf
Diagnosis of failing scan cells through orthogonal response compaction.
ETS
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2010 J jnl
High Volume Diagnosis in Memory BIST Based on Compressed Failure Data.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2009 A conf
Fault diagnosis for embedded read-only memories.
ITC
Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2009 Misc conf
High-Speed On-Chip Event Counters for Embedded Systems.
VLSI Design
Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2008 A conf
High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST.
ITC
Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2007 J jnl
Fault Diagnosis With Convolutional Compactors.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2007 J jnl
Isolation of Failing Scan Cells through Convolutional Test Response Compaction.
J. Electron. Test.
Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer
2006 B conf
Convolutional Compactors with Variable Polynomials.
ETS
Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2005 B conf
Convolutional compaction-driven diagnosis of scan failures.
ETS
Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang
2005 A conf
Diagnosis with convolutional compactors in presence of unknown states.
ITC
Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer
2004 A conf
Fault Diagnosis in Designs with Convolutional Compactors.
ITC
Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski