Arkadiusz Glowacki

11 papers Journal 11
YearRankTypeTitle / Venue / Authors
2014 J jnl
Backside spectroscopic photon emission microscopy using intensified silicon CCD.
Microelectron. Reliab.
Arkadiusz Glowacki, Christian Boit, Philippe Perdu, Yoshitaka Iwaki
2014 J jnl
New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery.
Microelectron. Reliab.
Ponky Ivo, Eunjung Melanie Cho, Przemyslaw Kotara, Lars Schellhase, Richard Lossy, Ute Zeimer, Anna Mogilatenko, Joachim Würfl, Günther Tränkle, Arkadiusz Glowacki, Christian Boit
2012 J jnl
Comparison of FET electro-optical modulation for 1300 nm and 1064 nm laser sources.
Microelectron. Reliab.
Carlo Pagano, Christian Boit, Arkadiusz Glowacki, Reiner Leihkauf, Yoshiyuki Yokoyama
2012 J jnl
Optimum Si thickness for backside detection of photon emission using Si-CCD.
Microelectron. Reliab.
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
2011 J jnl
Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements.
Microelectron. Reliab.
Ponky Ivo, Arkadiusz Glowacki, Eldad Bahat-Treidel, Richard Lossy, Joachim Würfl, Christian Boit, Günther Tränkle
2011 J jnl
Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation.
Microelectron. Reliab.
Sanjib Kumar Brahma, Arkadiusz Glowacki, Reiner Leihkauf, Christian Boit
2011 J jnl
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning.
Microelectron. Reliab.
Arkadiusz Glowacki, Christian Boit, Philippe Perdu
2009 J jnl
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures.
Microelectron. Reliab.
Arkadiusz Glowacki, Piotr Laskowski, Christian Boit, Ponky Ivo, Eldad Bahat-Treidel, Reza Pazirandeh, Richard Lossy, Joachim Würfl, Günther Tränkle
2008 J jnl
Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits.
Microelectron. Reliab.
Piotr Laskowski, Arkadiusz Glowacki, Christian Boit
2005 J jnl
Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout.
Microelectron. Reliab.
Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki
2004 J jnl
Localization of FET Device Performance with Thermal Laser Stimulation.
Microelectron. Reliab.
Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki, Hiroyoshi Suzuki