Antonio Raffo

22 papers Journal 11Unranked 10
YearRankTypeTitle / Venue / Authors
2026 J jnl
Flexible Automatic Design of GaN PA Based on Gaussian Process-Assisted Nondominated Sorting Genetic Algorithm.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Weiwei Wang, Bingjie Sun, Shichang Chen, Kuiwen Xu, Jialin Cai, Antonio Raffo, Nicola Donato, Giovanni Crupi, Gaofeng Wang
2025 J jnl
Essential Oils as Antimicrobials against
J. Chem. Inf. Model.
Roberta Astolfi, Alessandra Oliva, Antonio Raffo, Filippo Sapienza, Alessio Ragno, Eleonora Proia, Claudio M. Mastroianni, Cristina Luceri, Mijat Bozovic, Milan Mladenovic, Rosanna Papa, Patrizia Bottoni, Elena Mazzinelli, Giuseppina Nocca, Rino Ragno
2024 J jnl
A New Calibration Technique of Electromagnetic Simulators for Accurate Analyses of Microwave Components on Epitaxial Wafers.
IEEE Access
Ken Kikuchi, Antonio Raffo, Valeria Vadalà, Gianni Bosi, Giorgio Vannini, Hiroshi Yamamoto
2024 J jnl
Theoretical and Experimental Analysis of a CSWPL Behavioral Model for Microwave GaN Transistors Including DC Bias Voltages.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Xiaoqiang Tang, Antonio Raffo, Nicola Donato, Giovanni Crupi, Jialin Cai
2023 — conf
GaN HEMT Small-Signal Modeling Using an Optimization Strategy Based on Gated Recurrent Unit Networks.
MetroXRAINE
Jialin Cai, Giovanni Gugliandolo, Zlatica Marinkovic, Mariangela Latino, Enza Fazio, Gianni Bosi, Antonio Raffo, Giovanni Crupi, Nicola Donato
2022 J jnl
Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power Amplifiers.
IEICE Trans. Electron.
Hiroshi Yamamoto, Ken Kikuchi, Valeria Vadalà, Gianni Bosi, Antonio Raffo, Giorgio Vannini
2018 — conf
Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers.
BCICTS
Hiroshi Yamamoto, Ken Kikuchi, Norihiko Ui, Kazutaka Inoue, Valeria Vadalà, Gianni Bosi, Antonio Raffo, Giorgio Vannini
2018 — conf
Complex Permittivity Effect on the Performances of Non-invasive Microwave Blood Glucose Sensing: Enhanced Model and Preliminary Results.
WorldCIST (2)
Sandra Costanzo, Vincenzo Cioffi, Antonio Raffo
2018 J jnl
Dual-Layer Single-Varactor Driven Reflectarray Cell for Broad-Band Beam-Steering and Frequency Tunable Applications.
IEEE Access
Sandra Costanzo, Francesca Venneri, Antonio Raffo, Giuseppe Di Massa
2018 — conf
Quadrature Receiver Benefits in CW Doppler Radar Sensors for Vibrations Detection.
WorldCIST (2)
Antonio Raffo, Sandra Costanzo, Vincenzo Cioffi
2017 — conf
Doppler Elaboration for Vibrations Detection Using Software Defined Radar.
WorldCIST (2)
Antonio Raffo, Sandra Costanzo
2017 — conf
Impact of transistor model uncertainty on microwave load-pull simulations.
I2MTC
Gianni Bosi, Antonio Raffo, Giorgio Vannini, Gustavo Avolio, Dominique Schreurs
2017 J jnl
Software Defined Doppler Radar as a Contactless Multipurpose Microwave Sensor for Vibrations Monitoring.
Sensors
Antonio Raffo, Sandra Costanzo, Giuseppe Di Massa
2016 — conf
Environmental Effects on the Performances of a UHF Passive Tag-Based Commercial RFID System.
WorldCIST (2)
Sandra Costanzo, Antonio Costanzo, Antonio Raffo, Antonio Borgia
2016 — conf
Software-Defined Radar System for Landslides Monitoring.
WorldCIST (2)
Sandra Costanzo, Giuseppe Di Massa, Antonio Costanzo, Antonio Borgia, Antonio Raffo, Giuseppe Viggiani, Pasquale Versace
2015 — conf
Low-Cost Radars Integrated into a Landslide Early Warning System.
WorldCIST (2)
Sandra Costanzo, Giuseppe Di Massa, Antonio Costanzo, Luca Morrone, Antonio Raffo, Francesco Spadafora, Antonio Borgia, Giuseppe Formetta, Giovanna Capparelli, Pasquale Versace
2015 — conf
Novel Varactor-Loaded Phasing Line for Reflectarray Unit Cell with Large Reconfigurability Frequency Range.
WorldCIST (2)
Sandra Costanzo, Francesca Venneri, Antonio Raffo, Giuseppe Di Massa, Pasquale Corsonello
2011 J jnl
A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices.
Comput. Stand. Interfaces
Antonio Raffo, Valeria Vadalà, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini, Fabio Filicori
2011 J jnl
Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime.
Microelectron. Reliab.
Antonio Raffo, Sergio Di Falco, Giovanna Sozzi, Roberto Menozzi, Dominique M. M.-P. Schreurs, Giorgio Vannini
2009 J jnl
An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime.
IEEE Trans. Instrum. Meas.
Antonio Raffo, Valeria Di Giacomo, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini
2006 J jnl
Automated microwave-device characterization setup based on a technology-independent generalized bias system.
IEEE Trans. Instrum. Meas.
Pier Andrea Traverso, Antonio Raffo, Massimo Pirazzini, Alberto Santarelli, Fabio Filicori
2006 — —
Nonlinear modelling of low-frequency dispersive effects in microwave electron devices.
Antonio Raffo