| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2024 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2023 | — | conf |
A Semi-Supervised Learning Approach for Fault Detection and Diagnosis in Complex Mechanical Systems.
CASE
|
| 2023 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2021 | J | jnl |
Comput. Ind. Eng.
|
| 2021 | — | conf |
SOHOMA
|
| 2021 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2021 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2020 | J | jnl |
Eur. J. Oper. Res.
|
| 2020 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2019 | J | jnl |
IEEE Trans. Reliab.
|
| 2019 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2019 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2018 | J | jnl |
IEEE Trans. Reliab.
|
| 2018 | J | jnl |
Comput. Ind. Eng.
|
| 2018 | J | jnl |
Int. J. Prod. Res.
|
| 2018 | J | jnl |
Eur. J. Oper. Res.
|
| 2017 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2017 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
IEEE Trans. Reliab.
|
| 2015 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2015 | J | jnl |
Int. J. Syst. Sci.
|
| 2015 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
Eur. J. Oper. Res.
|
| 2013 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2011 | J | jnl |
Math. Comput. Model.
|
| 2011 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2010 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2008 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2007 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2006 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2006 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2005 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2005 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2003 | J | jnl |
IEEE Trans. Reliab.
|
| 2003 | J | jnl |
Eur. J. Oper. Res.
|
| 2003 | C | conf |
ACC
|
| 2002 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2002 | J | jnl |
IEEE Trans. Reliab.
|
| 2001 | C | conf |
ACC
|
| 1997 | J | jnl |
J. Intell. Manuf.
|