Anthony P. Ambler

25 papers A* 1A 12C 3Journal 5Unranked 3

Year	Rank	Type	Title / Venue / Authors
2009	C	`conf`	A HW/SW Co-design Methodology: An Accurate Power Efficiency Model and Design Metrics for Embedded System. SNPD Lftikhar Khan, Taikyeong T. Jeong, Gyung-Leen Park, Anthony P. Ambler
2006	A	`conf`	Behavioral Test Economics. ITC Scott Davidson, Anthony P. Ambler, Helen Davidson
2006	—	`conf`	Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and System. ICCSA (5) Taikyeong T. Jeong, Anthony P. Ambler
2005	—	`conf`	Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set. ISVLSI Il-soo Lee, Yu-Ting Lin, Anthony P. Ambler
2005	—	`conf`	Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume. ISVLSI Il-soo Lee, Jae-Hoon Jeong, Anthony P. Ambler
2002	A	`conf`	Is It Rocket Science? ITC Anthony P. Ambler
2002	A	`conf`	System Manufacturing Test Cost Model. ITC David Williams, Anthony P. Ambler
2001	A	`conf`	From DFT to systems test - a model based cost optimization tool. DATE Michael G. Wahl, Anthony P. Ambler, Christoph Maaß, Mohammed Rahman
2000	—	`ed.`	Services Management in Intelligent Networks, 11th IFIP/IEEE International Workshop on Distributed Systems: Operations and Management, DSOM 2000, Austin, Texas, USA, December 4-6, 2000, Proceedings DSOM Anthony P. Ambler, Seraphin B. Calo, Gautam Kar
1997	J	`jnl`	The Economics of System-Level Testing. IEEE Des. Test Comput. Des Farren, Anthony P. Ambler
1995	A	`conf`	Cost-Effective System-Level Test Strategies. ITC Des Farren, Anthony P. Ambler
1994	J	`jnl`	Sensitivity analysis in economics based test strategy planning. J. Electron. Test. J. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler
1994	A	`conf`	System Test Cost Modelling Based on Event Rate Analysis. ITC Des Farren, Anthony P. Ambler
1994	J	`jnl`	Test strategy planning using economic analysis. J. Electron. Test. I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick
1993	A	`conf`	Algorithms for Cost Optimised Test Strategy Selection. ITC Chryssa Dislis, J. H. Dick, Anthony P. Ambler
1993	A	`conf`	Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. ITC Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler
1993	C	`conf`	Economics in Design and Test. ICCD Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick
1993	J	`jnl`	The application and use of boundary scan: Bleeker, H, van den Eijnden, P and de Jong, FBoundary-scan test - a practical approach Kluwer Academic (1992) ISBN 0 7923 9296 5, £50.75, pp 222. Microprocess. Microsystems Anthony P. Ambler
1992	A	`conf`	A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits. ITC Alaa F. Alani, Gerry Musgrave, Anthony P. Ambler
1991	J	`jnl`	Economic Effects in Design and Test. IEEE Des. Test Comput. I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick
1989	A	`conf`	Cost Analysis of Test Method Environments. ITC Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler
1988	C	`conf`	Estimation of area and performance overheads for testable VLSI circuits. ICCD J. R. Miles, Anthony P. Ambler, K. A. E. Totton
1986	A	`conf`	Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. ITC Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear
1984	A	`conf`	An Analysis of the Economics of Self Test. ITC Prab Varma, Anthony P. Ambler, Keith Baker
1984	A*	`conf`	Ultimate: A hardware logic simulation engine. DAC M. E. Glazier, Anthony P. Ambler