Anshuman Chandra

50 papers A* 2A 7B 3Misc 7Journal 15Unranked 15

Year	Rank	Type	Title / Venue / Authors
2026	J	`jnl`	Evaluation of novel topiramate-phenolic acid conjugates as potent pancreatic α-amylase inhibitors: in vitro and in silico insights. J. Comput. Aided Mol. Des. Ipsa Padhy, Tripti Sharma, Anshuman Chandra, Abanish Biswas
2025	B	`conf`	DFT Techniques For Efficient 3D IC Interconnect Test For Chiplet and Multi-Die Package. ETS Anshuman Chandra, Chi-Chun Yang, Quoc Phan, Martin Keim
2025	—	`conf`	Descriptive Language For 3D IC Die-to-Die Interconnect Repair For IEEE P3405 Standard. ITC-Asia Ashish Reddy Bommana, Anshuman Chandra, Moiz Khan
2025	Misc	`conf`	Test, Debug, and Repair for Chiplet-Based Designs. VTS Anshuman Chandra, Esteban Garita-Rodríguez, Pradipta Ghosh
2025	B	`conf`	Testing Functional Interfaces And Complex PADs Within Multi-Die Packages With IEEE P3405. ETS Anshuman Chandra, Nir Sever, Martin Keim
2024	B	`conf`	New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405. ETS Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra
2024	A	`conf`	Physical-Aware Interconnect Test for Multi-Die Systems Using 3Dblox Open Standard. ITC Sandeep Kumar Goel, Ankita Patidar, Moiz Khan, Frank Lee, Anshuman Chandra, Martin Keim, Naim Lemar, Jonathan Gaudet, Quoc Phan, Vidya Neerkundar
2023	A	`conf`	A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation. ITC Anshuman Chandra, Moiz Khan, Ankita Patidar, Fumiaki Takashima, Sandeep Kumar Goel, Bharath Shankaranarayanan, Vuong Nguyen, Vistrita Tyagi, Manish Arora
2015	—	`conf`	Designing effective scan compression solutions for industrial circuits. ISQED Subramanian Chebiyam, Anshuman Chandra, Rohit Kapur
2015	—	`conf`	Designing efficient combinational compression architecture for testing industrial circuits. VDAT Anshuman Chandra, Santosh Kulkarni, Subramanian Chebiyam, Rohit Kapur
2014	—	`conf`	A Case Study on Implementing Compressed DFT Architecture. ATS Anshuman Chandra, Subramanian Chebiyam, Rohit Kapur
2014	—	`conf`	Unifying scan compression. DFT Swapnil Bahl, Shreyans Rungta, Shray Khullar, Rohit Kapur, Anshuman Chandra, Salvatore Talluto, Pramod Notiyath, Ajay Rajagopalan
2013	Misc	`conf`	Special session 11B: Hot topic on-chip clocking - Industrial trends. VTS Anshuman Chandra
2011	—	`conf`	3D-Scalable Adaptive Scan (3D-SAS). 3DIC Uzair Shah Syed, Krishnendu Chakrabarty, Anshuman Chandra, Rohit Kapur
2011	—	`conf`	Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C). Asian Test Symposium Anshuman Chandra, Jyotirmoy Saikia, Rohit Kapur
2009	—	`conf`	Proactive management of X's in scan chains for compression. ISQED Anshuman Chandra, Yasunari Kanzawa, Rohit Kapur
2009	A	`conf`	Scalable Adaptive Scan (SAS). DATE Anshuman Chandra, Rohit Kapur, Yasunari Kanzawa
2008	Misc	`conf`	Bounded Adjacent Fill for Low Capture Power Scan Testing. VTS Anshuman Chandra, Rohit Kapur
2008	—	`conf`	Interval Based X-Masking for Scan Compression Architectures. ISQED Anshuman Chandra, Rohit Kapur
2008	A	`conf`	Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction. DATE Anshuman Chandra, Felix Ng, Rohit Kapur
2008	—	`conf`	Not All Xs are Bad for Scan Compression. ATS Anshuman Chandra, Rohit Kapur
2007	J	`jnl`	DFT MAX and Power. J. Low Power Electron. Rohit Kapur, T. Finklea, Felix Ng, Anshuman Chandra, Sanjay Ramnath, Peter Wohl, Thomas W. Williams, Ashok Anbalan, Sandeep S. Kulkarni, Tammy Fernandes, Pramod Notiyath, Rajesh Uppuluri
2007	J	`jnl`	Embedded Test Decompressor to Reduce the Required Channels and Vector Memory of Tester for Complex Processor Circuit. IEEE Trans. Very Large Scale Integr. Syst. Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra
2007	Misc	`conf`	Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction. VTS Anshuman Chandra, Haihua Yan, Rohit Kapur
2006	J	`jnl`	Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes. IEEE Trans. Instrum. Meas. Yinhe Han, Xiaowei Li, Huawei Li, Anshuman Chandra
2006	J	`jnl`	Response compaction for system-on-a-chip based on advanced convolutional codes. Sci. China Ser. F Inf. Sci. Yinhe Han, Huawei Li, Xiaowei Li, Anshuman Chandra
2005	—	`conf`	Scan Data Volume Reduction Using Periodically Alterable MUXs Decompressor. Asian Test Symposium Yinhe Han, Xiaowei Li, Shivakumar Swaminathan, Yu Hu, Anshuman Chandra
2005	J	`jnl`	Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Tester Channels Reduction. J. Comput. Sci. Technol. Yinhe Han, Xiaowei Li, Huawei Li, Anshuman Chandra
2005	J	`jnl`	Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores. IEICE Trans. Inf. Syst. Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra, Xiaoqing Wen
2004	J	`jnl`	Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes. J. Electron. Test. Anshuman Chandra, Krishnendu Chakrabarty
2004	—	`conf`	Rapid and Energy-Efficient Testing for Embedded Cores. Asian Test Symposium Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman Chandra
2004	—	`conf`	Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes. DFT Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman Chandra
2003	—	`conf`	A Uni.ed SOC Test Approach Based on Test Data Compression and TAM Design. DFT Vikram Iyengar, Anshuman Chandra
2003	A	`conf`	A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization. DATE Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty
2003	J	`jnl`	A unified approach to reduce SOC test data volume, scan power and testing time. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Anshuman Chandra, Krishnendu Chakrabarty
2003	J	`jnl`	Test Data Compression and Test Resource Partitioning for System-on-a-Chip Using Frequency-Directed Run-Length (FDR) Codes. IEEE Trans. Computers Anshuman Chandra, Krishnendu Chakrabarty
2003	—	`conf`	Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Teste. Asian Test Symposium Yinhe Han, Yongjun Xu, Huawei Li, Xiaowei Li, Anshuman Chandra
2002	Misc	`conf`	How Effective are Compression Codes for Reducing Test Data Volume? VTS Anshuman Chandra, Krishnendu Chakrabarty, Rafael A. Medina
2002	J	`jnl`	Low-power scan testing and test data compression forsystem-on-a-chip. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Anshuman Chandra, Krishnendu Chakrabarty
2002	A*	`conf`	Reduction of SOC test data volume, scan power and testing time using alternating run-length codes. DAC Anshuman Chandra, Krishnendu Chakrabarty
2002	A	`conf`	Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression. DATE Anshuman Chandra, Krishnendu Chakrabarty
2002	—	`book`	Test Resource Partitioning for System-on-a-Chip. Krishnendu Chakrabarty, Vikram Iyengar, Anshuman Chandra
2002	J	`jnl`	Test data compression and decompression based on internal scanchains and Golomb coding. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Anshuman Chandra, Krishnendu Chakrabarty
2001	A*	`conf`	Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip. DAC Anshuman Chandra, Krishnendu Chakrabarty
2001	J	`jnl`	Efficient Test Application for Core-Based Systems Using Twisted-Ring Counters. VLSI Design Anshuman Chandra, Krishnendu Chakrabarty, Mark C. Hansen
2001	A	`conf`	Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding. DATE Anshuman Chandra, Krishnendu Chakrabarty
2001	Misc	`conf`	Frequency-Directed Run-Length (FDR) Codes with Application to System-on-a-Chip Test Data Compression. VTS Anshuman Chandra, Krishnendu Chakrabarty
2001	J	`jnl`	System-on-a-chip test-data compression and decompressionarchitectures based on Golomb codes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Anshuman Chandra, Krishnendu Chakrabarty
2001	J	`jnl`	Test Resource Partitioning for SOCs. IEEE Des. Test Comput. Anshuman Chandra, Krishnendu Chakrabarty
2000	Misc	`conf`	Test Data Compression for System-on-a-Chip Using Golomb Codes. VTS Anshuman Chandra, Krishnendu Chakrabarty