Anne Meixner

11 papers A 6Misc 2Journal 1Unranked 2
YearRankTypeTitle / Venue / Authors
2013 Misc conf
An IDDQ BIST approach to characterize phase-locked loop parameters.
VTS
Samed Maltabas, Osman Kubilay Ekekon, Kemal Kulovic, Anne Meixner, Martin Margala
2012 — conf
Improving IO test and system evaluation via data sharing.
DTIS
Anne Meixner, Salem Abdennadher
2011 Misc conf
An industrial case study of analog fault modeling.
VTS
Ender Yilmaz, Anne Meixner, Sule Ozev
2008 A conf
External Loopback Testing Experiences with High Speed Serial Interfaces.
ITC
Anne Meixner, Akira Kakizawa, Benoit Provost, Serge Bedwani
2004 — conf
Design considerations and DFT to enable testing of digital interfaces.
CICC
Mike Tripp, T. M. Mak, Anne Meixner
2004 A conf
Elimination of Traditional Functional Testing of Interface Timings at Intel.
ITC
Mike Tripp, T. M. Mak, Anne Meixner
2004 J jnl
Testing Gbps Interfaces without a Gigahertz Tester.
IEEE Des. Test Comput.
T. M. Mak, Mike Tripp, Anne Meixner
2003 A conf
Elimination of Traditional Functional Testing of Interface Timings at Intel.
ITC
Mike Tripp, T. M. Mak, Anne Meixner
1997 A conf
Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique.
ITC
Anne Meixner, Jash Banik
1996 A conf
Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique.
ITC
Anne Meixner, Jash Banik
1991 A conf
Fault Modeling for the Testing of Mixed Integrated Circuits.
ITC
Anne Meixner, Wojciech Maly