Anne Gattiker

14 papers A 6Misc 3Journal 3Unranked 2
YearRankTypeTitle / Venue / Authors
2019 — conf
Video-Text Compliance: Activity Verification Based on Natural Language Instructions.
ICCV Workshops
Mayoore Jaiswal, H. Peter Hofstee, Valerie Chen, Suvadip Paul, Rogério Feris, Frank Liu, Anupama Jagannathan, Anne Gattiker, Inseok Hwang, Jinho Lee, Matthew Tong, Sahil Dureja, Soham Shah
2015 J jnl
The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking.
IEEE J. Solid State Circuits
Eric J. Fluhr, Steve Baumgartner, David W. Boerstler, John F. Bulzacchelli, Timothy Diemoz, Daniel Dreps, George English, Joshua Friedrich, Anne Gattiker, Tilman Gloekler, Christopher J. Gonzalez, Jason Hibbeler, Keith A. Jenkins, Yong Kim, Paul Muench, Ryan Nett, Jose Paredes, Juergen Pille, Donald W. Plass, Phillip J. Restle, Raphael Robertazzi, David Shan, David W. Siljenberg, Michael A. Sperling, Kevin Stawiasz, Gregory S. Still, Zeynep Toprak Deniz, James D. Warnock, Glen A. Wiedemeier, Victor V. Zyuban
2014 A conf
Big data and test.
ITC
Anne Gattiker
2014 J jnl
Circuit and Physical Design of the zEnterprise™ EC12 Microprocessor Chips and Multi-Chip Module.
IEEE J. Solid State Circuits
James D. Warnock, Yuen H. Chan, Hubert Harrer, Sean M. Carey, Gerard Salem, Doug Malone, Ruchir Puri, Jeffrey A. Zitz, Adam Jatkowski, Gerald Strevig, Ayan Datta, Anne Gattiker, Aditya Bansal, Guenter Mayer, Yiu-Hing Chan, Mark D. Mayo, David L. Rude, Leon J. Sigal, Thomas Strach, Howard H. Smith, Huajun Wen, Pak-kin Mak, Chung-Lung Kevin Shum, Donald W. Plass, Charles F. Webb
2014 Misc conf
Unstructured text: Test analysis techniques applied to non-test problems.
VTS
Anne Gattiker
2013 — conf
5.5GHz system z microprocessor and multi-chip module.
ISSCC
James D. Warnock, Yuen H. Chan, Hubert Harrer, David L. Rude, Ruchir Puri, Sean M. Carey, Gerard Salem, Guenter Mayer, Yiu-Hing Chan, Mark D. Mayo, Adam Jatkowski, Gerald Strevig, Leon J. Sigal, Ayan Datta, Anne Gattiker, Aditya Bansal, Doug Malone, Thomas Strach, Huajun Wen, Pak-kin Mak, Chung-Lung Kevin Shum, Donald W. Plass, Charles F. Webb
2012 Misc conf
An oscillation-based test structure for timing information extraction.
VTS
Eun Jung Jang, Anne Gattiker, Sani R. Nassif, Jacob A. Abraham
2011 Misc conf
Invited paper: Yin and Yang of embedded sensors for post-scaling-era.
VTS
Anne Gattiker
2010 A conf
System-level impact of chip-level failure mechanisms and screens.
ICCAD
Anne Gattiker
2008 A conf
Unraveling Variability for Process/Product Improvement.
ITC
Anne Gattiker
2008 A conf
Using test data to improve IC quality and yield.
ICCAD
Anne Gattiker
2007 J jnl
Guest Editor's Introduction: Getting More Out of Test.
IEEE Des. Test Comput.
Anne Gattiker
2006 A ed.
2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006
ITC
Scott Davidson, Anne Gattiker
2006 A conf
Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment.
ITC
Anne Gattiker, Manjul Bhushan, Mark B. Ketchen