Anne E. Gattiker

31 papers A 11B 1Misc 4Journal 10Unranked 5
YearRankTypeTitle / Venue / Authors
2019 J jnl
Accelerating Conversational Agents Built With Off-the-Shelf Modularized Services.
IEEE Pervasive Comput.
Jinho Lee, Inseok Hwang, Thomas Hubregtsen, Anne E. Gattiker, Christopher M. Durham
2018 J jnl
SimplerVoice: A Key Message & Visual Description Generator System for Illiteracy.
CoRR
Minh N. B. Nguyen, Samuel Thomas, Anne E. Gattiker, Sujatha Kashyap, Kush R. Varshney
2017 B conf
SCI-FII: Speculative Conversational Interface Framework for Incremental Inference on Modularized Services.
MDM
Jinho Lee, Inseok Hwang, Thomas Hubregtsen, Anne E. Gattiker, Christopher M. Durham
2013 J jnl
Big Data text-oriented benchmark creation for Hadoop.
IBM J. Res. Dev.
Anne E. Gattiker, Fadi H. Gebara, H. Peter Hofstee, J. D. Hayes, A. Hylick
2013 Misc conf
Hardware Acceleration of an Efficient and Accurate Proton Therapy Monte Carlo.
ICCS
Thomas H. Osiecki, Min-Yu Tsai, Anne E. Gattiker, Damir A. Jamsek, Sani R. Nassif, William Evan Speight, Cliff C. N. Sze
2012 J jnl
Guest Editors' Introduction: Yield Learning Processes and Methods.
IEEE Des. Test Comput.
Anne E. Gattiker, Phil Nigh
2011 Misc conf
Efficient and product-representative timing model validation.
VTS
Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham
2011 — conf
Post-Silicon Timing Validation Method Using Path Delay Measurements.
Asian Test Symposium
Eun Jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham
2011 A conf
Using well/substrate bias manipulation to enhance voltage-test-based defect detection.
ITC
Anne E. Gattiker, Phil Nigh
2006 J jnl
Getting More out of ITC.
IEEE Des. Test Comput.
Anne E. Gattiker
2006 J jnl
High-performance CMOS variability in the 65-nm regime and beyond.
IBM J. Res. Dev.
Kerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer
2006 — conf
IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM.
ISPD
Anne E. Gattiker
2004 A conf
Diagnosis Meets Physical Failure Analysis: How Long can we Succeed?
ITC
Anne E. Gattiker
2004 A conf
Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions.
ITC
Phil Nigh, Anne E. Gattiker
2003 A conf
Deformations of IC Structure in Test and Yield Learning.
ITC
Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey
2003 J jnl
Power supply transient signal analysis for defect-oriented test.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker
2002 J jnl
Modeling the Economics of Testing: A DFT Perspective.
IEEE Des. Test Comput.
Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly
2002 Misc conf
Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models.
VTS
Abhishek Singh, Jim Plusquellic, Anne E. Gattiker
2002 — conf
Static timing analysis based circuit-limited-yield estimation.
ISCAS (5)
Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long
2002 — conf
Test structures for delay variability.
Timing Issues in the Specification and Synthesis of Digital Systems
Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu
2001 A conf
Detecting delay faults using power supply transient signal analysis.
ITC
Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker
2001 — conf
Timing Yield Estimation from Static Timing Analysis.
ISQED
Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long
2000 A conf
Test method evaluation experiments and data.
ITC
Phil Nigh, Anne E. Gattiker
1998 A conf
Current signatures: application [to CMOS].
ITC
Anne E. Gattiker, Wojciech Maly
1998 A conf
Toward understanding "Iddq-only" fails.
ITC
Anne E. Gattiker, Wojciech Maly
1997 A conf
Current Signatures: Application.
ITC
Anne E. Gattiker, Wojciech Maly
1997 J jnl
Smart Substrate MCMs.
J. Electron. Test.
Anne E. Gattiker, Wojciech Maly
1997 A conf
To DFT or Not to DFT?
ITC
Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly
1996 Misc conf
Current signatures [VLSI circuit testing].
VTS
Anne E. Gattiker, Wojciech Maly
1994 A conf
Feasibility Study of Smart Substrate Multichip Modules.
ITC
Anne E. Gattiker, Wojciech Maly
1994 J jnl
Smart-Substrate Multichip-Module Systems.
IEEE Des. Test Comput.
Wojciech Maly, Derek B. I. Feltham, Anne E. Gattiker, Mark D. Hobaugh, Kenneth Backus, Michael E. Thomas