Ann Patterson-Hine

13 papers A* 1A 3B 1Journal 7Unranked 1
YearRankTypeTitle / Venue / Authors
2011 A* conf
Using model-based assurance to strengthen diagnostic procedures.
ASE
Robyn R. Lutz, Jeremy Johnson, Ann Patterson-Hine
2010 J jnl
A Comprehensive Diagnosis Methodology for Complex Hybrid Systems: A Case Study on Spacecraft Power Distribution Systems.
IEEE Trans. Syst. Man Cybern. Part A
Matthew J. Daigle, Indranil Roychoudhury, Gautam Biswas, Xenofon D. Koutsoukos, Ann Patterson-Hine, Scott Poll
2009 J jnl
Dynamic Multiple-Fault Diagnosis With Imperfect Tests.
IEEE Trans. Syst. Man Cybern. Part A
Sui Ruan, Yunkai Zhou, Feili Yu, Krishna R. Pattipati, Peter Willett, Ann Patterson-Hine
2008 A conf
Using Fault Modeling in Safety Cases.
ISSRE
Robyn R. Lutz, Ann Patterson-Hine
2007 J jnl
Using obstacle analysis to identify contingency requirements on an unpiloted aerial vehicle.
Requir. Eng.
Robyn R. Lutz, Ann Patterson-Hine, Stacy Nelson, Chad R. Frost, Doron Tal, Robert Harris
2006 A conf
Tool-Supported Verification of Contingency Software Design in Evolving, Autonomous Systems.
ISSRE
Robyn R. Lutz, Ann Patterson-Hine, Anupa Bajwa
2005 A conf
Identifying Contingency Requirements Using Obstacle Analysis.
RE
Robyn R. Lutz, Stacy Nelson, Ann Patterson-Hine, Chad R. Frost, Doron Tal
2004 J jnl
On a multimode test sequencing problem.
IEEE Trans. Syst. Man Cybern. Part B
Sui Ruan, Fang Tu, Krishna R. Pattipati, Ann Patterson-Hine
2004 — conf
Optimal sensor allocation for fault detection and isolation.
SMC (2)
Mohammad Azam, Krishna R. Pattipati, Ann Patterson-Hine
2000 J jnl
A hidden Markov model-based algorithm for fault diagnosis with partial and imperfect tests.
IEEE Trans. Syst. Man Cybern. Part C
Jie Ying, Thia Kirubarajan, Krishna R. Pattipati, Ann Patterson-Hine
2000 J jnl
Sequential testing algorithms for multiple fault diagnosis.
IEEE Trans. Syst. Man Cybern. Part A
Mojdeh Shakeri, Vijay Raghavan, Krishna R. Pattipati, Ann Patterson-Hine
1998 J jnl
Optimal and near-optimal algorithms for multiple fault diagnosis with unreliable tests.
IEEE Trans. Syst. Man Cybern. Part C
Mojdeh Shakeri, Krishna R. Pattipati, Vijay Raghavan, Ann Patterson-Hine
1998 B conf
Verification and validation of high integrity software generated by automatic code generators.
SMC
V. N. Malepati, H. Li, Krishna R. Pattipati, Somnath Deb, Ann Patterson-Hine