Anis Uzzaman - RankMe

16 papers A 1Journal 2Unranked 13

Year	Rank	Type	Title / Venue / Authors
2010	J	`jnl`	Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression. IEICE Trans. Inf. Syst. Anis Uzzaman, Brion L. Keller, Brian Foutz, Sandeep Bhatia, Thomas Bartenstein, Masayuki Arai, Kazuhiko Iwasaki
2009	—	`conf`	A Partially-Exhaustive Gate Transition Fault Model. Asian Test Symposium Brion L. Keller, Dale Meehl, Anis Uzzaman, Richard Billings
2009	J	`jnl`	Automatic Handling of Programmable On-Product Clock Generation (OPCG) Circuitry for Low Power Aware Delay Test. J. Low Power Electron. Anis Uzzaman, Brion L. Keller, Thomas J. Snethen, Kazuhiko Iwasaki, Masayuki Arai
2009	—	`conf`	Is Low Power Testing Necessary? What does the Test Industry Truly Need?. Asian Test Symposium Anis Uzzaman
2009	—	`conf`	Why is Conventional ATPG Not Sufficient for Advanced Low Power Designs?. Asian Test Symposium Krishna Chakravadhanula, Vivek Chickermane, Brion L. Keller, Patrick R. Gallagher Jr., Anis Uzzaman
2008	—	`conf`	How To Increase the Effectiveness of Yield Diagnostics-Is DFM the Answer to This? ATS Anis Uzzaman
2008	—	`conf`	Optimizing Test Data Volume Using Hybrid Compression. ATS Brion L. Keller, Sandeep Bhatia, Thomas Bartenstein, Brian Foutz, Anis Uzzaman
2007	—	`conf`	A Review of Power Strategies for DFT and ATPG. ATS Brion L. Keller, Tom Jackson, Anis Uzzaman
2007	A	`conf`	Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation. ITC Anis Uzzaman, Bibo Li, Thomas J. Snethen, Brion L. Keller, Gary Grise
2007	—	`conf`	Test Roles in Diagnosis and Silicon Debug. ATS Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera
2007	—	`conf`	Using Programmable On-Product Clock Generation (OPCG) for Delay Test. ATS Brion L. Keller, Anis Uzzaman, Bibo Li, Thomas J. Snethen
2006	—	`conf`	A Scalable Architecture for On-Chip Compression: Options and Trade-Offs. ATS Anis Uzzaman, Brion L. Keller, Vivek Chickermane
2006	—	`conf`	Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis. ATS Sanae Seike, Ken Namura, Yukio Ohya, Anis Uzzaman, Shinichi Arima, Dale Meehl, Vivek Chickermane, Azumi Kobayashi, Satoshi Tanaka, Hiroyuki Adachi
2006	—	`conf`	Not all Delay Tests Are the Same - SDQL Model Shows True-Time. ATS Anis Uzzaman, Mick Tegethoff, Bibo Li, Kevin McCauley, Shuji Hamada, Yasuo Sato
2005	—	`conf`	Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression. Asian Test Symposium Hiroyuki Nakamura, Akio Shirokane, Yoshihito Nishizaki, Anis Uzzaman, Vivek Chickermane, Brion L. Keller, Tsutomu Ube, Yoshihiko Terauchi
2005	—	`conf`	Practical Aspects of Delay Testing for Nanometer Chips. Asian Test Symposium Vivek Chickermane, Brion L. Keller, Kevin McCauley, Anis Uzzaman