Anis Hoayek

11 papers C 1Journal 7Unranked 3
YearRankTypeTitle / Venue / Authors
2025 J jnl
Assessing clustering methods using Shannon's entropy.
Inf. Sci.
Anis Hoayek, Didier Rullière
2025 J jnl
Big GCVAE: decision-making with adaptive transformer model for failure root cause analysis in semiconductor industry.
J. Intell. Manuf.
Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher, Pascal Gounet, Jérôme Adrian
2025 J jnl
Correction: Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry.
J. Intell. Manuf.
Zhiqiang Wang, Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher
2025 — conf
Coupling Variable Selection and Anomaly Detection: Record-Based Approach.
MENACOMM
Michel Kamel, Anis Hoayek, Mireille Batton-Hubert
2025 J jnl
Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry.
J. Intell. Manuf.
Zhiqiang Wang, Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher
2024 — conf
Anomaly Detection in a Production Line: Statistical Learning Approach and Industrial Application.
APMS (5)
Rida Kheirallah, Anis Hoayek, Frédéric Grimaud, Mireille Batton-Hubert, Patrick Burlat
2024 J jnl
Unsupervised approach for an optimal representation of the latent space of a failure analysis dataset.
J. Supercomput.
Abbas Rammal, Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert
2022 J jnl
GCVAE: Generalized-Controllable Variational AutoEncoder.
CoRR
Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher
2022 J jnl
Leveraging Pre-trained Models for Failure Analysis Triplets Generation.
CoRR
Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher, Pascal Gounet, Jérôme Adrian
2022 C conf
NLP based on GCVAE for intelligent Fault Analysis in Semiconductor industry.
ETFA
Zhiqiang Wang, Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher
2021 — conf
Intelligent Fault Analysis Decision Flow in Semiconductor Industry 4.0 Using Natural Language Processing with Deep Clustering.
CASE
Kenneth Ezukwoke, Houari Toubakh, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher, Pascal Gounet