| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Embed. Syst. Lett.
|
| 2026 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2025 | J | jnl |
IT Prof.
|
| 2025 | J | jnl |
Microprocess. Microsystems
|
| 2025 | — | conf |
SOCC
|
| 2025 | — | conf |
SOCC
|
| 2025 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2025 | J | jnl |
IT Prof.
|
| 2025 | J | jnl |
IEEE Des. Test
|
| 2025 | J | jnl |
IET Comput. Digit. Tech.
|
| 2024 | J | jnl |
IEEE Des. Test
|
| 2024 | J | jnl |
SN Comput. Sci.
|
| 2024 | — | conf |
iSES
|
| 2024 | — | conf |
iSES
|
| 2024 | — | conf |
iSES
|
| 2024 | — | conf |
ICCE-Taiwan
|
| 2024 | — | conf |
SOCC
|
| 2024 | — | conf |
iSES
|
| 2024 | J | jnl |
SN Comput. Sci.
|
| 2024 | J | jnl |
IEEE Embed. Syst. Lett.
|
| 2024 | J | jnl |
Integr.
|
| 2024 | J | jnl |
IEEE Embed. Syst. Lett.
|
| 2024 | — | conf |
ICCE-Taiwan
|
| 2024 | — | conf |
iSES
|
| 2024 | — | conf |
iSES
|
| 2024 | J | jnl |
IEEE Des. Test
|
| 2024 | — | conf |
iSES
|
| 2024 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2024 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
IT Prof.
|
| 2023 | — | conf |
iSES
|
| 2023 | J | jnl |
Microprocess. Microsystems
|
| 2023 | J | jnl |
Microprocess. Microsystems
|
| 2023 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2023 | J | jnl |
Comput. Electr. Eng.
|
| 2023 | — | conf |
DFT
|
| 2023 | — | conf |
ICM
|
| 2023 | — | conf |
AsianHOST
|
| 2023 | — | conf |
iSES
|
| 2023 | — | conf |
iSES
|
| 2023 | J | jnl |
Expert Syst. Appl.
|
| 2023 | J | jnl |
Comput. Electr. Eng.
|
| 2023 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2023 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2023 | — | conf |
ICM
|
| 2023 | — | conf |
iSES
|
| 2022 | — | conf |
iSES
|
| 2022 | — | ch. |
Behavioral Synthesis for Hardware Security
|
| 2022 | — | conf |
iSES
|
| 2022 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2022 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | — | conf |
iSES
|
| 2022 | — | conf |
iSES
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2021 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2021 | — | conf |
iSES
|
| 2021 | — | conf |
iSES
|
| 2020 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2020 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2020 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | — | conf |
ICCE-Berlin
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
ICCE-Berlin
|
| 2019 | C | conf |
ICCE
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2019 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2019 | — | conf |
ICCE-Berlin
|
| 2019 | — | conf |
ICCE-Berlin
|
| 2019 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2019 | C | conf |
ICCE
|
| 2019 | — | ch. |
Security and Fault Tolerance in Internet of Things
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | C | conf |
ICCE
|
| 2019 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2019 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2019 | — | conf |
ICCE-Berlin
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2018 | J | jnl |
Future Gener. Comput. Syst.
|
| 2018 | — | conf |
ISVLSI
|
| 2018 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2018 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2018 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2018 | C | conf |
ICCE
|
| 2018 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2018 | — | conf |
ISVLSI
|
| 2018 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2018 | C | conf |
ICCE
|
| 2018 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2018 | J | jnl |
IEEE Trans. Aerosp. Electron. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | — | conf |
iNIS
|
| 2017 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2017 | J | jnl |
Adv. Eng. Softw.
|
| 2017 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2017 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2017 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Integr.
|
| 2017 | J | jnl |
Future Gener. Comput. Syst.
|
| 2017 | J | jnl |
IET Comput. Digit. Tech.
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2016 | C | conf |
ISCAS
|
| 2016 | J | jnl |
IEEE Access
|
| 2016 | J | jnl |
IEEE Access
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2015 | J | jnl |
Appl. Math. Comput.
|
| 2015 | J | jnl |
Adv. Eng. Softw.
|
| 2015 | — | conf |
VLSI-DAT
|
| 2015 | J | jnl |
Expert Syst. Appl.
|
| 2015 | — | conf |
CCECE
|
| 2015 | — | conf |
CCECE
|
| 2015 | — | conf |
iNIS
|
| 2015 | J | jnl |
Int. J. Knowl. Based Intell. Eng. Syst.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2015 | — | conf |
ISQED
|
| 2014 | J | jnl |
Expert Syst. Appl.
|
| 2014 | — | conf |
CCECE
|
| 2014 | — | conf |
CCECE
|
| 2014 | — | conf |
ICIT
|
| 2014 | B | conf |
KES
|
| 2014 | — | conf |
ISQED
|
| 2014 | J | jnl |
Adv. Eng. Softw.
|
| 2013 | — | conf |
ICACCI
|
| 2013 | — | conf |
ICACCI
|
| 2012 | J | jnl |
Swarm Evol. Comput.
|
| 2012 | J | jnl |
Microprocess. Microsystems
|
| 2011 | — | conf |
ACAI
|
| 2011 | — | conf |
ACAI
|
| 2011 | — | conf |
CCECE
|
| 2011 | — | conf |
CCECE
|