| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2021 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2019 | — | ed. |
VDAT
|
| 2018 | J | jnl |
IET Comput. Digit. Tech.
|
| 2018 | — | conf |
iSES
|
| 2017 | C | conf |
CLOSER
|
| 2017 | — | conf |
iNIS
|
| 2017 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2017 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2017 | — | conf |
iNIS
|
| 2017 | — | conf |
iNIS
|
| 2016 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2016 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2016 | — | conf |
ISVLSI
|
| 2016 | — | conf |
iNIS
|
| 2016 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2014 | J | jnl |
Comput. Syst. Sci. Eng.
|
| 2014 | — | conf |
ISED
|
| 2014 | — | conf |
ISVLSI
|
| 2014 | — | conf |
ICIT
|
| 2011 | — | conf |
ISQED
|
| 2011 | J | jnl |
Microprocess. Microsystems
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2010 | C | conf |
ISCAS
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2010 | C | conf |
ISCAS
|