| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Signal Process. Lett.
|
| 2025 | J | jnl |
IEEE Signal Process. Lett.
|
| 2025 | J | jnl |
Swarm Evol. Comput.
|
| 2024 | J | jnl |
Circuits Syst. Signal Process.
|
| 2024 | Misc | conf |
VLSID
|
| 2023 | J | jnl |
Circuits Syst. Signal Process.
|
| 2023 | J | jnl |
Circuits Syst. Signal Process.
|
| 2023 | J | jnl |
Circuits Syst. Signal Process.
|
| 2023 | J | jnl |
Circuits Syst. Signal Process.
|
| 2022 | J | jnl |
IEEE Signal Process. Lett.
|
| 2022 | J | jnl |
Digit. Signal Process.
|
| 2022 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2022 | J | jnl |
J. Parallel Distributed Comput.
|
| 2022 | J | jnl |
IEEE Signal Process. Lett.
|
| 2021 | J | jnl |
IEEE Signal Process. Lett.
|
| 2021 | J | jnl |
Circuits Syst. Signal Process.
|
| 2021 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2021 | J | jnl |
J. Parallel Distributed Comput.
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | A | conf |
FPGA
|
| 2020 | Misc | conf |
FCCM
|
| 2020 | J | jnl |
IEEE Trans. Circuits Syst.
|
| 2020 | J | jnl |
J. Electron. Test.
|
| 2019 | J | jnl |
J. Signal Process. Syst.
|
| 2019 | — | conf |
iSES
|
| 2019 | J | jnl |
J. Parallel Distributed Comput.
|
| 2019 | Misc | conf |
ACSSC
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2019 | J | jnl |
IET Circuits Devices Syst.
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2019 | J | jnl |
Microelectron. J.
|
| 2019 | Misc | conf |
VLSID
|
| 2018 | C | conf |
ISCAS
|
| 2018 | J | jnl |
CoRR
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | J | jnl |
J. Signal Process. Syst.
|
| 2018 | J | jnl |
Circuits Syst. Signal Process.
|
| 2018 | — | conf |
ARC
|
| 2018 | Misc | conf |
VLSID
|
| 2018 | — | conf |
IPDPS Workshops
|
| 2018 | J | jnl |
Circuits Syst. Signal Process.
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
CoRR
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2017 | J | jnl |
IET Circuits Devices Syst.
|
| 2017 | J | jnl |
J. Cell. Autom.
|
| 2017 | J | jnl |
IET Circuits Devices Syst.
|
| 2017 | J | jnl |
IET Circuits Devices Syst.
|
| 2017 | — | conf |
VDAT
|
| 2017 | — | conf |
VDAT
|
| 2017 | Misc | conf |
HiPC
|
| 2017 | J | jnl |
Microelectron. J.
|
| 2016 | J | jnl |
J. Real Time Image Process.
|
| 2016 | — | conf |
VDAT
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | Misc | conf |
VLSID
|
| 2016 | J | jnl |
J. Real Time Image Process.
|
| 2016 | J | jnl |
J. Circuits Syst. Comput.
|
| 2016 | — | conf |
VDAT
|
| 2016 | J | jnl |
Circuits Syst. Signal Process.
|
| 2015 | J | jnl |
Circuits Syst. Signal Process.
|
| 2015 | C | conf |
ISCAS
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2014 | — | conf |
VDAT
|
| 2014 | J | jnl |
CORDIC-Based VLSI Architecture for Implementing Kaiser-Bessel Window in Real Time Spectral Analysis.
J. Signal Process. Syst.
|
| 2014 | — | conf |
VDAT
|
| 2013 | J | jnl |
J. Signal Process. Syst.
|
| 2012 | J | jnl |
IEEE Syst. J.
|
| 2012 | — | conf |
VDAT
|
| 2012 | — | conf |
ISED
|
| 2012 | Misc | conf |
VLSI Design
|
| 2010 | J | jnl |
Microprocess. Microsystems
|
| 2010 | — | conf |
APCCAS
|
| 2006 | C | conf |
ISCAS
|
| 2005 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2005 | Misc | conf |
VLSI Design
|
| 2005 | J | jnl |
Microprocess. Microsystems
|
| 2004 | Misc | conf |
VLSI Design
|
| 2004 | — | conf |
ISCAS (2)
|
| 2004 | — | conf |
ISCAS (2)
|
| 2003 | — | conf |
ICECS
|
| 2001 | Misc | conf |
ICASSP
|
| 2001 | J | jnl |
Microprocess. Microsystems
|
| 2000 | — | conf |
EUSIPCO
|
| 1992 | Misc | conf |
VLSI Design
|