Anil Kumar Gundu

13 papers C 1Misc 1Journal 2Unranked 9
YearRankTypeTitle / Venue / Authors
2024 — conf
E-Textile Battery-Less Walking Step Counting System with <23 pW Power, Dual-Function Harvesting from Breathing, and No High-Voltage CMOS Process.
VLSI Technology and Circuits
Anil Kumar Gundu, Luigi Fassio, Massimo Alioto
2022 C conf
Impact of Sheet Width and Silicon Height in 3D Stacked Nanosheet GAA Transistor Technology.
ISCAS
Anil Kumar Gundu, Volkan Kursun
2021 J jnl
Novel low leakage and energy efficient dual-pullup/dual-pulldown repeater.
Integr.
Anil Kumar Gundu, Volkan Kursun
2021 — conf
Optimization of 3D Stacked Nanosheets in 5nm Gate-all-around Transistor Technology.
SoCC
Anil Kumar Gundu, Volkan Kursun
2019 — conf
Energy Efficient Clock Distribution with Low-Leakage Multi-Vt Buffers.
PATMOS
Anil Kumar Gundu, Volkan Kursun
2019 J jnl
Low Leakage Clock Tree With Dual-Threshold- Voltage Split Input-Output Repeaters.
IEEE Trans. Very Large Scale Integr. Syst.
Anil Kumar Gundu, Volkan Kursun
2016 Misc conf
A New Sense Amplifier Topology with Improved Performance for High Speed SRAM Applications.
VLSID
Anil Kumar Gundu, Mohammad S. Hashmi, Anuj Grover
2016 — conf
A high speed low voltage latch type sense amplifier for non-volatile memory.
VDAT
Disha Arora, Anil Kumar Gundu, Mohammad S. Hashmi
2016 — conf
A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation.
SoCC
Nidhi Batra, Shashwat Kaushik, Anil Kumar Gundu, Mohammad S. Hashmi, G. S. Visweswaran, Anuj Grover
2016 — conf
A regression based methodology to estimate SNM for improving yield of 6T SRAM.
MWSCAS
Anil Kumar Gundu, Mohammad S. Hashmi, Ramkesh Sharma
2016 — conf
An effective test methodology enabling detection of weak bits in SRAMs: Case study in 28nm FDSOI.
VDAT
Nidhi Batra, Anil Kumar Gundu, Mohammad S. Hashmi, G. S. Visweswaran, Anuj Grover
2016 — conf
Modeling and yield estimation of SRAM sub-system for different capacities subjected to parametric variations.
VDAT
Pulkit Sharma, Anil Kumar Gundu, Mohammad S. Hashmi
2015 — conf
Statistical analysis and parametric yield estimation of standard 6T SRAM cell for different capacities.
SoCC
Anil Kumar Gundu, Mohammad S. Hashmi, Ramkesh Sharma, Naushad Ansari