Aneesh Balakrishnan

22 papers C 4Journal 10Unranked 8

Year	Rank	Type	Title / Venue / Authors
2025	J	`jnl`	Accelerate SEU Simulation-Based Fault Injection With Spatio-Temporal Graph Convolutional Networks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Li Lu, Junchao Chen, Aneesh Balakrishnan, Markus Ulbricht, Milos Krstic
2025	—	`conf`	On-Chip Aging Sensor Core for Silicon Lifecycle Management. LATS Fabian Vargas, Aneesh Balakrishnan
2021	J	`jnl`	Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects. CoRR Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2021	J	`jnl`	Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. CoRR Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux
2021	—	`conf`	Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis. ISQED Aneesh Balakrishnan, Dan Alexandrescu, Maksim Jenihhin, Thomas Lange, Maximilien Glorieux
2021	J	`jnl`	Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors. CoRR Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2021	—	`conf`	Modeling Soft-Error Reliability Under Variability. DFT Aneesh Balakrishnan, Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Said Hamdioui, Maksim Jenihhin, Dan Alexandrescu
2021	C	`conf`	On Antagonism Between Side-Channel Security and Soft-Error Reliability in BNN Inference Engines. VLSI-SoC Xinhui Lai, Thomas Lange, Aneesh Balakrishnan, Dan Alexandrescu, Maksim Jenihhin
2021	J	`jnl`	The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications. CoRR Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2020	—	`conf`	Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects. MECO Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2020	C	`conf`	Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. IOLTS Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux
2020	C	`conf`	Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. IOLTS Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2020	J	`jnl`	Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. CoRR Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2020	J	`jnl`	Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. CoRR Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2020	J	`jnl`	On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques. CoRR Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2019	—	`conf`	Challenges of Reliability Assessment and Enhancement in Autonomous Systems. DFT Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu
2019	J	`jnl`	Challenges of Reliability Assessment and Enhancement in Autonomous Systems. CoRR Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu
2019	C	`conf`	Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. IOLTS Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2019	—	`conf`	Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors. AHS Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2019	—	`conf`	On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques. DSN (Supplements) Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
2019	—	`conf`	The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications. NORCAS Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
2019	J	`jnl`	Understanding multidimensional verification: Where functional meets non-functional. Microprocess. Microsystems Xinhui Lai, Aneesh Balakrishnan, Thomas Lange, Maksim Jenihhin, Tara Ghasempouri, Jaan Raik, Dan Alexandrescu