| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2024 | J | jnl |
IEEE Trans. Engineering Management
|
| 2023 | J | jnl |
Sensors
|
| 2022 | J | jnl |
Array
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
Sensors
|
| 2021 | J | jnl |
Sensors
|
| 2021 | J | jnl |
Sensors
|
| 2021 | J | jnl |
Sensors
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
Sensors
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
Robotics Comput. Integr. Manuf.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IET Wirel. Sens. Syst.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Sensors
|
| 2017 | J | jnl |
Void Formation and Their Effect on Reliability of Lead-Free Solder Joints on MID and PCB Substrates.
IEEE Trans. Reliab.
|