André K. Nieuwland

14 papers A 1C 7Journal 5Unranked 1
YearRankTypeTitle / Venue / Authors
2008 J jnl
Power Consumption of Fault Tolerant Busses.
IEEE Trans. Very Large Scale Integr. Syst.
Daniele Rossi, André K. Nieuwland, Steven V. E. S. van Dijk, Richard P. Kleihorst, Cecilia Metra
2008 J jnl
Simultaneous Switching Noise: The Relation between Bus Layout and Coding.
IEEE Des. Test Comput.
Daniele Rossi, André K. Nieuwland, Cecilia Metra
2006 C conf
Combinational Logic Soft Error Analysis and Protection.
IOLTS
André K. Nieuwland, Samir Jasarevic, Goran Jerin
2005 C conf
Coding Techniques for Low Switching Noise in Fault Tolerant Busses.
IOLTS
André K. Nieuwland, Atul Katoch, Daniele Rossi, Cecilia Metra
2005 J jnl
Exploiting ECC Redundancy to Minimize Crosstalk Impact.
IEEE Des. Test Comput.
Daniele Rossi, André K. Nieuwland, Atul Katoch, Cecilia Metra
2005 J jnl
New ECC for Crosstalk Impact Minimization.
IEEE Des. Test Comput.
Daniele Rossi, André K. Nieuwland, Atul Katoch, Cecilia Metra
2005 C conf
On-Line Testing for Secure Implementations: Design and Validation.
IOLTS
Régis Leveugle, Yervant Zorian, Luca Breveglieri, André K. Nieuwland, Klaus Rothbart, Jean-Pierre Seifert
2004 C conf
Automated Logic SER Analysis and On-Line SER reduction.
IOLTS
André K. Nieuwland, Patrick Gindner
2004 J jnl
IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors.
J. Electron. Test.
André K. Nieuwland, Richard P. Kleihorst
2004 C conf
Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems.
IOLTS
Daniele Rossi, A. Muccio, André K. Nieuwland, Atul Katoch, Cecilia Metra
2004 — conf
Reducing Cross-Talk Induced Power Consumption and Delay.
PATMOS
André K. Nieuwland, Atul Katoch, Maurice Meijer
2004 A conf
Why Transition Coding for Power Minimization of On-Chip Buses Does Not Work.
DATE
Claudia Kretzschmar, André K. Nieuwland, Dietmar Müller
2003 C conf
Power Consumption of Fault Tolerant Codes: the Active Elements.
IOLTS
Daniele Rossi, Steven V. E. S. van Dijk, Richard P. Kleihorst, André K. Nieuwland, Cecilia Metra
2003 C conf
The positive effect on IC yield of embedded Fault Tolerance for SEUs.
IOLTS
André K. Nieuwland, Richard P. Kleihorst