| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Access
|
| 2025 | Misc | conf |
VTS
|
| 2025 | — | conf |
IRPS
|
| 2024 | — | conf |
IRPS
|
| 2024 | Misc | conf |
VTS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Des. Test
|
| 2023 | Misc | conf |
VTS
|
| 2023 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2022 | B | conf |
ETS
|
| 2022 | — | conf |
ISQED
|
| 2021 | C | conf |
PRDC
|
| 2019 | — | conf |
VLSI-DAT
|
| 2018 | — | conf |
CPS-SPC@CCS
|
| 2018 | C | conf |
PRDC
|
| 2018 | — | conf |
IOT
|
| 2016 | C | conf |
ISCAS
|
| 2016 | — | conf |
ICECS
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | C | conf |
ISCAS
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | — | ed. |
NOCS
|
| 2015 | A | conf |
ICCAD
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2014 | — | conf |
MWSCAS
|
| 2014 | — | conf |
LASCAS
|
| 2014 | J | jnl |
IEEE Des. Test
|
| 2014 | — | conf |
ICECS
|
| 2014 | J | jnl |
IEEE Des. Test
|
| 2014 | — | conf |
SoCC
|
| 2014 | — | conf |
SoCC
|
| 2014 | J | jnl |
IEEE Des. Test
|
| 2013 | J | jnl |
IEEE Trans. Computers
|
| 2012 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2012 | J | jnl |
Sustain. Comput. Informatics Syst.
|
| 2011 | — | conf |
IDT
|
| 2011 | — | conf |
Post-silicon code coverage evaluation with reduced area overhead for functional verification of SoC.
HLDVT
|
| 2011 | — | conf |
SBCCI
|
| 2011 | C | conf |
IOLTS
|
| 2011 | — | conf |
IGCC
|
| 2010 | — | ed. |
IDT
|
| 2010 | J | jnl |
IEEE Des. Test Comput.
|
| 2009 | J | jnl |
IET Comput. Digit. Tech.
|
| 2009 | J | jnl |
Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits.
J. Electron. Test.
|
| 2008 | J | jnl |
IEEE Trans. Educ.
|
| 2008 | C | conf |
ISCAS
|
| 2007 | — | conf |
CICC
|
| 2007 | J | jnl |
CoRR
|
| 2007 | — | conf |
MSE
|
| 2007 | J | jnl |
Integr.
|
| 2007 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2007 | C | conf |
IOLTS
|
| 2007 | — | conf |
DFT
|
| 2007 | J | jnl |
IET Comput. Digit. Tech.
|
| 2007 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2007 | — | conf |
NOCS
|
| 2006 | Misc | conf |
VTS
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | — | conf |
DFT
|
| 2006 | — | conf |
DFT
|
| 2006 | C | conf |
IOLTS
|
| 2006 | Misc | conf |
VTS
|
| 2006 | J | jnl |
Proc. IEEE
|
| 2005 | — | conf |
ISCAS (6)
|
| 2005 | — | conf |
ISCAS (6)
|
| 2005 | A | conf |
ITC
|
| 2005 | A | conf |
DATE
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2005 | — | conf |
ASP-DAC
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2005 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2005 | J | jnl |
IEEE Des. Test Comput.
|
| 2005 | — | conf |
ISCAS (2)
|
| 2005 | J | jnl |
IEEE Des. Test Comput.
|
| 2005 | — | conf |
DFT
|
| 2005 | J | jnl |
IEEE Trans. Computers
|
| 2005 | Misc | conf |
VTS
|
| 2005 | J | jnl |
Microelectron. J.
|
| 2004 | — | conf |
ISQED
|
| 2004 | — | conf |
DFT
|
| 2004 | J | jnl |
IEEE Des. Test Comput.
|
| 2004 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2004 | A | conf |
ITC
|
| 2004 | J | jnl |
IEEE Des. Test Comput.
|
| 2004 | Misc | conf |
VLSI Design
|
| 2004 | Misc | conf |
VTS
|
| 2004 | Misc | conf |
VTS
|
| 2004 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2003 | J | jnl |
IEEE Des. Test Comput.
|
| 2003 | Misc | conf |
VTS
|
| 2003 | — | conf |
ISCAS (4)
|
| 2003 | — | conf |
ISCAS (5)
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | — | conf |
IWSOC
|
| 2003 | — | conf |
MTDT
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | A | conf |
DATE
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2002 | A | conf |
ITC
|
| 2002 | — | conf |
IOLTW
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2002 | A | conf |
ITC
|
| 2002 | — | conf |
LATW
|
| 2002 | J | jnl |
IEEE Des. Test Comput.
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2001 | — | conf |
ETW
|
| 2001 | — | conf |
IOLTW
|
| 2001 | — | conf |
Asian Test Symposium
|
| 2001 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 2000 | Misc | conf |
VTS
|
| 2000 | J | jnl |
J. Electron. Test.
|
| 2000 | — | conf |
LATW
|
| 2000 | Misc | conf |
VTS
|
| 1999 | Misc | conf |
VTS
|
| 1999 | — | conf |
ISCAS (2)
|
| 1999 | A | conf |
ITC
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1997 | — | conf |
Asian Test Symposium
|
| 1996 | J | jnl |
IEEE Des. Test Comput.
|
| 1996 | J | jnl |
IEEE Trans. Computers
|
| 1995 | J | jnl |
J. Electron. Test.
|
| 1995 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1995 | C | conf |
ISCAS
|
| 1995 | J | jnl |
IEEE Des. Test Comput.
|
| 1995 | J | jnl |
IEEE Trans. Computers
|
| 1994 | J | jnl |
J. Electron. Test.
|
| 1994 | — | conf |
DFT
|
| 1993 | Misc | conf |
VTS
|
| 1993 | J | jnl |
IEEE Trans. Computers
|
| 1993 | — | conf |
FTCS
|
| 1993 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1992 | Misc | conf |
VTS
|
| 1992 | J | jnl |
IEEE Trans. Computers
|
| 1992 | J | jnl |
IEEE Trans. Commun.
|
| 1992 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1992 | J | jnl |
Integr.
|
| 1992 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1991 | A | conf |
ITC
|
| 1991 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1990 | A | conf |
ICCAD
|
| 1990 | A | conf |
ITC
|
| 1989 | A | conf |
ITC
|
| 1989 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1988 | — | conf |
FTCS
|
| 1988 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1988 | A | conf |
ITC
|
| 1986 | A | conf |
ITC
|