| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2019 | C | conf |
IOLTS
|
| 2013 | C | conf |
IOLTS
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2010 | B | conf |
ETS
|
| 2010 | A | conf |
ITC
|
| 2009 | B | conf |
ETS
|
| 2009 | J | jnl |
Microelectron. J.
|
| 2008 | J | jnl |
VLSI Design
|
| 2008 | C | conf |
DDECS
|
| 2008 | J | jnl |
CoRR
|
| 2008 | J | jnl |
J. Electron. Test.
|
| 2007 | B | conf |
ETS
|
| 2007 | J | jnl |
J. Electron. Test.
|
| 2007 | J | jnl |
CoRR
|
| 2006 | J | jnl |
J. Electron. Test.
|
| 2006 | J | jnl |
J. Electron. Test.
|
| 2005 | B | conf |
ETS
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2005 | A | conf |
DATE
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | A | conf |
DATE
|
| 2001 | — | conf |
LATW
|
| 2001 | — | conf |
Asian Test Symposium
|
| 2001 | A | conf |
DATE
|
| 1999 | A | conf |
DATE
|
| 1998 | Misc | conf |
VTS
|
| 1998 | — | conf |
ICECS
|
| 1998 | Misc | conf |
VTS
|
| 1996 | J | jnl |
IEEE Des. Test Comput.
|
| 1994 | A | conf |
ITC
|