Andres F. Gomez

14 papers C 3Misc 1Journal 5Unranked 5
YearRankTypeTitle / Venue / Authors
2019 J jnl
An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects.
J. Electron. Test.
Andres F. Gomez, Víctor H. Champac
2018 — conf
A metric-guided gate-sizing methodology for aging guardband reduction.
LATS
Andres F. Gomez, Roberto Gómez, Víctor H. Champac
2018 — conf
Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection.
VLSI-SoC (Selected Papers)
Víctor H. Champac, Andres F. Gomez, Freddy Forero, Kaushik Roy
2018 C conf
Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations.
VLSI-SoC
Andres F. Gomez, Freddy Forero, Kaushik Roy, Víctor H. Champac
2018 J jnl
Selection of Critical Paths for Reliable Frequency Scaling under BTI-Aging Considering Workload Uncertainty and Process Variations Effects.
ACM Trans. Design Autom. Electr. Syst.
Andres F. Gomez, Víctor H. Champac
2016 — conf
A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage.
LATS
Freddy Forero, Andres F. Gomez, Víctor H. Champac
2016 — conf
Critical path selection under NBTI/PBTI aging for adaptive frequency tuning.
EWDTS
Andres F. Gomez, Víctor H. Champac
2016 J jnl
Early Selection of Critical Paths for Reliable NBTI Aging-Delay Monitoring.
IEEE Trans. Very Large Scale Integr. Syst.
Andres F. Gomez, Víctor H. Champac
2016 J jnl
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations.
Microelectron. Reliab.
Andres F. Gomez, Felipe Lavratti, Guilherme Medeiros Machado, M. Sartori, Letícia Maria Veiras Bolzani, Víctor H. Champac, Fabian Vargas
2016 J jnl
Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage.
J. Low Power Electron.
Freddy Forero, Andres F. Gomez, Víctor H. Champac
2015 C conf
A new sizing approach for lifetime improvement of nanoscale digital circuits due to BTI aging.
VLSI-SoC
Andres F. Gomez, Víctor H. Champac
2015 Misc conf
An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging.
VTS
Andres F. Gomez, Leticia B. Poehls, Fabian Vargas, Víctor H. Champac
2015 C conf
Circuit performance optimization for local intra-die process variations using a gate selection metric.
VLSI-SoC
Víctor H. Champac, Alejandra Nicte-ha Reyes, Andres F. Gomez
2015 — conf
Effective selection of favorable gates in BTI-critical paths to enhance circuit reliability.
LATS
Andres F. Gomez, Víctor H. Champac