Andreas Leininger

14 papers A 5B 3Misc 1Journal 3Unranked 1
YearRankTypeTitle / Venue / Authors
2016 A conf
Improving SRAM test quality by leveraging self-timed circuits.
DATE
Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger
2016 Misc conf
Thermal issues in test: An overview of the significant aspects and industrial practice.
VTS
Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser
2011 J jnl
Masking of X-Values by Use of a Hierarchically Configurable Register.
J. Electron. Test.
Thomas Rabenalt, Michael Gössel, Andreas Leininger
2009 B conf
Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment.
ETS
Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger
2009 B conf
Masking of X-values by Use of a Hierarchically Configurable Register.
ETS
Thomas Rabenalt, Michael Gössel, Andreas Leininger
2009 J jnl
X-tolerant Test Data Compaction with Accelerated Shift Registers.
J. Electron. Test.
Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel
2008 B conf
Accelerated Shift Registers for X-tolerant Test Data Compaction.
ETS
Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel
2007 A conf
Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques.
ITC
Andreas Leininger, Martin Fischer, Michael Richter, Michael Gössel
2006 — —
New diagnosis and test methods with high compaction rates.
Andreas Leininger
2006 — conf
The Next Step in Volume Scan Diagnosis: Standard Fail Data Format.
ATS
Andreas Leininger, Ajay Khoche, Martin Fischer, Nagesh Tamarapalli, Wu-Tung Cheng, Randy Klingenberg, Wu Yang
2005 A conf
Compression mode diagnosis enables high volume monitoring diagnosis flow.
ITC
Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai
2005 A conf
Evaluating ATE-equipment for volume diagnosis.
ITC
Ralf Arnold, Andreas Leininger
2004 J jnl
A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST.
J. Electron. Test.
Michael Gössel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger
2004 A conf
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code.
DATE
Andreas Leininger, Michael Gössel, Peter Muhmenthaler