Andreas Graff

11 papers Journal 7Unranked 4
YearRankTypeTitle / Venue / Authors
2021 — conf
Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress.
IRPS
Maximilian Dammann, Martina Baeumler, Tobias Kemmer, Helmer Konstanzer, Peter Brückner, Sebastian Krause, Andreas Graff, Michél Simon-Najasek
2020 — conf
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling.
IRPS
Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz
2018 — conf
Cathodoluminescence spectroscopy for failure analysis and process development of GaN-based microelectronic devices.
IRPS
C. Monachon, Marcin Stefan Zielinski, Jean Berney, D. Poppitz, Andreas Graff, Steffen Breuer, Lutz Kirste
2018 J jnl
Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology.
Microelectron. Reliab.
Maximilian Dammann, Martina Baeumler, Peter Brückner, Tobias Kemmer, Helmer Konstanzer, Andreas Graff, Michél Simon-Najasek, Rüdiger Quay
2018 — conf
Physical failure analysis methods for wide band gap semiconductor devices.
IRPS
Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann
2017 J jnl
High resolution physical analysis of ohmic contact formation at GaN-HEMT devices.
Microelectron. Reliab.
Andreas Graff, Michél Simon-Najasek, Frank Altmann, Ján Kuzmík, Dagmar Gregusová, S. Hascik, Helmut Jung, T. Baur, Jan Grünenpütt, Hervé Blanck
2017 J jnl
Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications.
Microelectron. Reliab.
Maximilian Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay, Michael Mikulla, Andreas Graff, Michél Simon-Najasek
2016 J jnl
Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures.
Microelectron. Reliab.
Mikael Broas, Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann, Helmut Jung, Hervé Blanck
2015 J jnl
Degradation of 0.25 μm GaN HEMTs under high temperature stress test.
Microelectron. Reliab.
Maximilian Dammann, Martina Baeumler, Peter Brückner, Wolfgang Bronner, Stephan Maroldt, Helmer Konstanzer, Matthias Wespel, Rüdiger Quay, Michael Mikulla, Andreas Graff, M. Lorenzini, M. Fagerlind, P. J. van der Wel, T. Rödle
2014 J jnl
Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures.
Microelectron. Reliab.
Michél Simon-Najasek, Susanne Hübner, Frank Altmann, Andreas Graff
2014 J jnl
Interface microstructure effects in Au thermosonic ball bonding contacts by high reliability wire materials.
Microelectron. Reliab.
Benjamin März, Andreas Graff, Robert Klengel, Matthias Petzold