Andreas Glowatz

28 papers A* 1A 9B 3C 4Misc 1Journal 5Unranked 5

Year	Rank	Type	Title / Venue / Authors
2025	B	`conf`	European Test Symposium Teams: an Anniversary Snapshot. ETS Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2025	—	`conf`	Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG. ITC-Asia Alessandro Ciullo, Stephan Eggersglüß, Daniel Tille, Andreas Glowatz, Giusy Iaria, Paolo Bernardi
2024	A	`conf`	A Cell-aware Transistor State Stress Model and its Application for Quality Measurement. ITC Stephan Eggersglüß, Andreas Glowatz
2023	A	`conf`	Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes. ITC Saidapet Ramesh, Rahul Kalyan, Jesse Yanez, Andreas Glowatz, Maija Ryynänen, Sergej Schwarz
2022	J	`jnl`	Affordable and Comprehensive Testing of 3-D Stacked Die Devices. IEEE Des. Test Jean-François Côté, Jeff Fan, Sean Shen, Givargis Danialy, Marcin Lipinski, Michael Garbers, Wu Yang, Martin Keim, Andreas Glowatz, Joe Reynick, Ayush Patel, Joanna Michna
2021	J	`jnl`	Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski
2021	—	`conf`	On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern Generation. ATS Xijiang Lin, Wu-Tung Cheng, Takeo Kobayashi, Andreas Glowatz
2018	A	`conf`	DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. ITC Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski
2014	J	`jnl`	Cell-Aware Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast
2014	B	`conf`	Cell-aware experiences in a high-quality automotive test suite. ETS Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenolé Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski
2013	C	`conf`	Fault collapsing of multi-conditional faults. DDECS Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke
2012	C	`conf`	A new SAT-based ATPG for generating highly compacted test sets. DDECS Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
2012	A	`conf`	Cell-aware Production test results from a 32-nm notebook processor. ITC Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jürgen Schlöffel, Janusz Rajski
2012	C	`conf`	Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. DSD Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz
2011	A	`conf`	Cell-aware analysis for small-delay effects and production test results from different fault models. ITC Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers
2010	A	`conf`	Defect-oriented cell-internal testing. ITC Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger
2010	J	`jnl`	MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. J. Electron. Test. Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Rolf Drechsler
2009	A	`conf`	Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
2009	Misc	`conf`	Restrict Encoding for Mixed-Mode BIST. VTS Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jürgen Schlöffel, Friedrich Hapke, Andreas Glowatz
2009	—	`conf`	Using a two-dimensional fault list for compact Automatic Test Pattern Generation. LATW Marc Messing, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
2008	J	`jnl`	On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Daniel Tille
2007	C	`conf`	Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. MEMOCODE Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
2007	B	`conf`	Computation and Application of Absolute Dominators in Industrial Designs. ETS Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel
2007	A	`conf`	Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. ITC Jeroen Geuzebroek, Erik Jan Marinissen, Ananta K. Majhi, Andreas Glowatz, Friedrich Hapke
2007	—	`conf`	Experimental Studies on SAT-Based ATPG for Gate Delay Faults. ISMVL Stephan Eggersglüß, Daniel Tille, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
2007	A	`conf`	Programmable deterministic Built-In Self-Test. ITC Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Laurent Souef
2006	A*	`conf`	Fault detection and diagnosis with parity trees for space compaction of test responses. DAC Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke
2005	—	`conf`	PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ISVLSI Junhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel