Andrea Schirru

15 papers C 1Misc 1Journal 3Unranked 10
YearRankTypeTitle / Venue / Authors
2018 — conf
A Fraud Detection Decision Support System via Human On-Line Behavior Characterization and Machine Learning.
AI4I
Gian Antonio Susto, Matteo Terzi, Chiara Masiero, Simone Pampuri, Andrea Schirru
2016 J jnl
Supervised Aggregative Feature Extraction for Big Data Time Series Regression.
IEEE Trans. Ind. Informatics
Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Seán F. McLoone
2015 J jnl
Machine Learning for Predictive Maintenance: A Multiple Classifier Approach.
IEEE Trans. Ind. Informatics
Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Seán F. McLoone, Alessandro Beghi
2015 J jnl
Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach.
Comput. Oper. Res.
Gian Antonio Susto, Simone Pampuri, Andrea Schirru, Alessandro Beghi, Giuseppe De Nicolao
2014 Misc conf
A sampling decision system for semiconductor manufacturing: relying on virtual metrology and actual measurements.
WSC
Daniel Kurz, Jürgen Pilz, Andrea Schirru, Simone Pampuri, Cristina De Luca
2013 — conf
A predictive maintenance system for integral type faults based on support vector machines: An application to ion implantation.
CASE
Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Daniele Pagano, Seán F. McLoone, Alessandro Beghi
2013 C conf
Prediction of integral type failures in semiconductor manufacturing through classification methods.
ETFA
Gian Antonio Susto, Seán F. McLoone, Daniele Pagano, Andrea Schirru, Simone Pampuri, Alessandro Beghi
2012 — conf
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control.
CASE
Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Giuseppe De Nicolao, Alessandro Beghi
2012 — conf
Learning from time series: Supervised Aggregative Feature Extraction.
CDC
Andrea Schirru, Gian Antonio Susto, Simone Pampuri, Seán F. McLoone
2012 — conf
Multistep virtual metrology approaches for semiconductor manufacturing processes.
CASE
Simone Pampuri, Andrea Schirru, Gian Antonio Susto, Cristina De Luca, Alessandro Beghi, Giuseppe De Nicolao
2011 — conf
Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing.
CASE
Simone Pampuri, Andrea Schirru, Giuseppe Fazio, Giuseppe De Nicolao
2011 — conf
Nonparametric Virtual Sensors for Semiconductor Manufacturing - Using Information Theoretic Learning and Kernel Machines.
ICINCO (2)
Andrea Schirru, Simone Pampuri, Cristina De Luca, Giuseppe De Nicolao
2011 — conf
Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing.
CASE
Simone Pampuri, Andrea Schirru, Cristina De Luca, Giuseppe De Nicolao
2010 — conf
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing.
CASE
Andrea Schirru, Simone Pampuri, Giuseppe De Nicolao
2010 — conf
Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing.
CASE
Andrea Schirru, Simone Pampuri, Giuseppe De Nicolao