Andrea Cester

26 papers Journal 18Unranked 8
YearRankTypeTitle / Venue / Authors
2024 J jnl
Design and in vitro Characterization of a Wearable Multisensing System for Hydration Monitoring.
IEEE Trans. Instrum. Meas.
Sarah Tonello, Alberto Zacchini, Alessandra Galli, Ata Golparvar, Ali Meimandi, Giacomo Peruzzi, Alessandro Pozzebon, Nicolò Lago, Andrea Cester, Giada Giorgi, Sandro Carrara, Claudio Narduzzi
2023 — conf
Signal amplification properties of Electrolyte-Gated Organic Field-Effect Transistors.
MetroInd4.0&IoT
Nicolò Lago, Sara Ruiz Molina, Marta Mas Torrent, Stefano Casalini, Andrea Cester
2022 J jnl
A Morphological Peak-Detector for Single-Unit Neural Recording Acquisition Systems.
IEEE Trans. Instrum. Meas.
Alessandra Galli, Nicolò Lago, Sarah Tonello, Mario Bortolozzi, Marco Buonomo, Morten Gram Pedersen, Andrea Cester, Giada Giorgi
2021 — conf
RL-EGOFET cell biosensors: A novel approach for the detection of action potentials.
MeMeA
Giada Giorgi, Nicolò Lago, Sarah Tonello, Alessandra Galli, M. Buonuomo, Morten Gram Pedersen, Andrea Cester
2020 — conf
Organic substrates for novel printed sensors in neural interfacing: a measurement method for cytocompatibility analysis.
MeMeA
Sarah Tonello, Giada Giorgi, Simona Pisu, Andrea Cester
2018 J jnl
Analysis of the effects of voltage pulses on P3HT: PCBM polymeric solar cells by means of TLP technique.
Microelectron. Reliab.
Marco Buonomo, Lorenzo Torto, Marco Barbato, Nicola Wrachien, Antonio Rizzo, Suren A. Gevorgyan, Frederik C. Krebs, Andrea Cester
2018 J jnl
Effects of stair case gate bias stress in IGZO/Al
Microelectron. Reliab.
Marco Buonomo, Nicola Wrachien, Nicolò Lago, Giuseppe Cantarella, Andrea Cester
2015 — conf
Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects.
IRPS
Andrea Cester, Nicola Wrachien, Massimiliano Bon, Gaudenzio Meneghesso, Roberta Bertani, Roberto Tagliaferro, Simone Casolucci, Thomas M. Brown, Andrea Reale, Aldo Di Carlo
2015 J jnl
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells.
Microelectron. Reliab.
Andrea Cester, Antonio Rizzo, A. Bazzega, Nicolò Lago, J. Favaro, Marco Barbato, Nicola Wrachien, Suren A. Gevorgyan, Michael Corazza, Frederik C. Krebs
2015 J jnl
Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics.
Microelectron. Reliab.
Nicola Wrachien, Nicolò Lago, Antonio Rizzo, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini, Gaudenzio Meneghesso, Andrea Cester
2015 — conf
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells.
IRPS
Marco Barbato, Matteo Meneghini, Andrea Cester, Alessandro Barbato, Enrico Zanoni, Gaudenzio Meneghesso, Giovanna Mura, Diego Tonini, A. Voltan, Giorgio Cellere
2014 — conf
Characterization of high-voltage charge-trapping effects in GaN-based power HEMTs.
ESSDERC
Davide Bisi, Antonio Stocco, Matteo Meneghini, Fabiana Rampazzo, Andrea Cester, Gaudenzio Meneghesso, Enrico Zanoni
2014 — conf
Effects of constant voltage stress on organic complementary logic inverters.
ESSDERC
Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini
2014 — conf
Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures.
ESSDERC
Marco Barbato, Andrea Cester, Viviana Mulloni, Benno Margesin, Giorgio De Pasquale, Aurelio Somà, Gaudenzio Meneghesso
2014 J jnl
Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states.
Microelectron. Reliab.
Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini
2013 J jnl
Comparison between positive and negative constant current stress on dye-sensitized solar cells.
Microelectron. Reliab.
Daniele Bari, Nicola Wrachien, R. Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester
2013 J jnl
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric.
Microelectron. Reliab.
Nicola Wrachien, Andrea Cester, Daniele Bari, Raffaella Capelli, Riccardo D'Alpaos, Michele Muccini, Andrea Stefani, Guido Turatti, Gaudenzio Meneghesso
2013 J jnl
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells.
Microelectron. Reliab.
Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso
2012 J jnl
Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure.
Microelectron. Reliab.
Nicola Wrachien, Daniel Bari, Jaroslav Kovác, Jan Jakabovic, Daniel Donoval, Gaudenzio Meneghesso, Andrea Cester
2012 J jnl
Reliability study of dye-sensitized solar cells by means of solar simulator and white LED.
Microelectron. Reliab.
Daniele Bari, Nicola Wrachien, Roberto Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester
2011 J jnl
Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs).
Microelectron. Reliab.
Daniele Bari, Nicola Wrachien, R. Tagliaferro, Stefano Penna, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester
2010 J jnl
Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED.
Microelectron. Reliab.
Andrea Cester, Daniele Bari, J. Framarin, Nicola Wrachien, Gaudenzio Meneghesso, S. Xia, V. Adamovich, J. J. Brown
2007 J jnl
Ionising radiation and electrical stress on nanocrystal memory cell array.
Microelectron. Reliab.
Andrea Cester, A. Gasperin, Nicola Wrachien, Alessandro Paccagnella, Valentina Ancarani, Cosimo Gerardi
2007 J jnl
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.
Microelectron. Reliab.
Javier Martín-Martínez, Simone Gerardin, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Andrea Cester, Alessandro Paccagnella, G. Ghidini
2006 J jnl
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress.
Microelectron. Reliab.
Simone Gerardin, Alessio Griffoni, Andrea Cester, Alessandro Paccagnella, G. Ghidini
2003 J jnl
Ionising radiation effects on MOSFET drain current.
Microelectron. Reliab.
S. Cimino, Andrea Cester, Alessandro Paccagnella, G. Ghidini