Amit Nahar - RankMe

22 papers A 10C 3Misc 5Journal 3Unranked 1

Year	Rank	Type	Title / Venue / Authors
2023	Misc	`conf`	Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing. VTS V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, D. Webster, Amit Nahar, Yiorgos Makris
2022	Misc	`conf`	Machine Learning-Based Overkill Reduction through Inter-Test Correlation. VTS Deepika Neethirajan, V. A. Niranjan, Richard Willis, Amit Nahar, D. Webster, Yiorgos Makris
2019	A	`conf`	Wafer-Level Adaptive Vmin Calibration Seed Forecasting. DATE Constantinos Xanthopoulos, Deepika Neethirajan, Sirish Boddikurapati, Amit Nahar, Yiorgos Makris
2018	Misc	`conf`	Special session on machine learning: How will machine learning transform test? VTS Yiorgos Makris, Amit Nahar, Haralampos-G. D. Stratigopoulos, Marc Hutner
2017	C	`conf`	Wafer-level adaptive trim seed forecasting based on E-tests. ISCAS Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris
2017	J	`jnl`	Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
2016	A	`conf`	A machine learning approach to fab-of-origin attestation. ICCAD Ali Ahmadi, Mohammad-Mahdi Bidmeshki, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
2016	C	`conf`	Harnessing fabrication process signature for predicting yield across designs. ISCAS Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
2016	A	`conf`	Harnessing process variations for optimizing wafer-level probe-test flow. ITC Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
2016	A	`conf`	Statistical outlier screening as a test solution health monitor. ITC David Shaw, Dirk Hoops, Kenneth M. Butler, Amit Nahar
2016	Misc	`conf`	Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. VTS Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
2016	A	`conf`	What we know after twelve years developing and deploying test data analytics solutions. ITC Kenneth M. Butler, Amit Nahar, W. Robert Daasch
2015	A	`conf`	Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. ICCAD Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
2015	Misc	`conf`	Yield prognosis for fab-to-fab product migration. VTS Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
2014	A	`conf`	IC laser trimming speed-up through wafer-level spatial correlation modeling. ITC Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris
2013	—	`conf`	Predicting die-level process variations from wafer test data for analog devices: A feasibility study. LATW Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee
2011	A	`conf`	Die-level adaptive test: Real-time test reordering and elimination. ITC Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar
2010	A	`conf`	Adapting to adaptive testing. DATE Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli
2009	J	`jnl`	Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch
2009	C	`conf`	Quality improvement and cost reduction using statistical outlier methods. ICCD Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger
2009	J	`jnl`	Statistics in Semiconductor Test: Going beyond Yield. IEEE Des. Test Comput. W. Robert Daasch, C. Glenn Shirley, Amit Nahar
2005	A	`conf`	Burn-in reduction using principal component analysis. ITC Amit Nahar, W. Robert Daasch, Suresh Subramaniam