| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2023 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2021 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2021 | J | jnl |
Soft-Error-Immune Read-Stability-Improved SRAM for Multi-Node Upset Tolerance in Space Applications.
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2020 | J | jnl |
IET Circuits Devices Syst.
|
| 2020 | J | jnl |
IET Circuits Devices Syst.
|
| 2019 | J | jnl |
IET Circuits Devices Syst.
|
| 2019 | J | jnl |
Microelectron. J.
|
| 2019 | J | jnl |
IET Circuits Devices Syst.
|
| 2018 | — | conf |
RAIT
|
| 2018 | J | jnl |
IEEE Access
|
| 2017 | — | conf |
ISED
|
| 2017 | — | conf |
ISED
|
| 2017 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2016 | J | jnl |
IET Circuits Devices Syst.
|
| 2016 | — | conf |
RAIT
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | J | jnl |
IET Circuits Devices Syst.
|
| 2015 | — | conf |
ReTIS
|
| 2015 | — | conf |
VDAT
|
| 2014 | J | jnl |
J. Low Power Electron.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2011 | — | conf |
ISED
|
| 2010 | — | conf |
ICT
|