| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
J. Hardw. Syst. Secur.
|
| 2026 | J | jnl |
Integr.
|
| 2026 | J | jnl |
Integr.
|
| 2026 | J | jnl |
Integr.
|
| 2024 | — | conf |
ICM
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2024 | — | conf |
ICM
|
| 2024 | — | conf |
VDAT
|
| 2024 | J | jnl |
Integr.
|
| 2024 | J | jnl |
Microelectron. J.
|
| 2024 | Misc | conf |
VLSID
|
| 2023 | — | conf |
ICECS
|
| 2023 | — | conf |
iSES
|
| 2023 | — | conf |
NorCAS
|
| 2023 | — | conf |
NEWCAS
|
| 2023 | J | jnl |
Microelectron. J.
|
| 2023 | — | conf |
PRIME
|
| 2023 | — | conf |
Radiation Hardened and Leakage Power Attack Resilient 12T SRAM Cell for Secure Nuclear Environments.
ACM Great Lakes Symposium on VLSI
|
| 2023 | — | conf |
VLSI-SoC (Selected Papers)
|
| 2023 | J | jnl |
IEEE Open J. Circuits Syst.
|
| 2023 | C | conf |
VLSI-SoC
|
| 2022 | — | conf |
VDAT
|
| 2022 | — | conf |
VDAT
|
| 2022 | J | jnl |
Microelectron. J.
|
| 2022 | — | conf |
VDAT
|
| 2022 | — | conf |
VDAT
|
| 2022 | — | ed. |
VDAT
|
| 2021 | J | jnl |
J. Circuits Syst. Comput.
|
| 2021 | B | conf |
ETS
|
| 2021 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2020 | J | jnl |
Circuits Syst. Signal Process.
|
| 2020 | C | conf |
IOLTS
|
| 2020 | J | jnl |
J. Electron. Test.
|
| 2019 | J | jnl |
Microelectron. J.
|
| 2019 | J | jnl |
Microelectron. J.
|
| 2019 | — | conf |
VDAT
|
| 2019 | — | conf |
ICECS
|
| 2019 | J | jnl |
IET Comput. Digit. Tech.
|
| 2019 | — | conf |
VDAT
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2017 | — | conf |
VDAT
|
| 2015 | — | conf |
IC3
|