| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Fast and efficient computing for deep learning-based defect detection models in lightweight devices.
J. Intell. Manuf.
|
| 2024 | — | conf |
SIU
|
| 2024 | J | jnl |
Clust. Comput.
|
| 2023 | J | jnl |
Concurr. Comput. Pract. Exp.
|
| 2022 | — | conf |
CVPR Workshops
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Concurr. Comput. Pract. Exp.
|
| 2022 | — | — |
|
| 2022 | Misc | conf |
SEC
|
| 2018 | J | jnl |
Concurr. Comput. Pract. Exp.
|
| 2017 | — | conf |
SIU
|
| 2015 | — | conf |
VTC Fall
|
| 2015 | — | conf |
SIU
|
| 2015 | — | conf |
UYMS
|
| 2014 | — | conf |
SIU
|