Alodeep Sanyal

22 papers A 3B 1C 4Misc 4Journal 6Unranked 4
YearRankTypeTitle / Venue / Authors
2017 A conf
DFM-aware fault model and ATPG for intra-cell and inter-cell defects.
ITC
Arani Sinha, Sujay Pandey, Ayush Singhal, Alodeep Sanyal, Alan Schmaltz
2014 Misc conf
Special session 11C: Young professionals in test - Elevator talks.
VTS
Alodeep Sanyal, Yanjing Li
2014 Misc conf
Special session 12C: Young professionals in test - Town meeting.
VTS
Alodeep Sanyal, Yanjing Li, Yervant Zorian
2013 Misc conf
Special session 12C: Town-hall meeting "young professionals in test".
VTS
Alodeep Sanyal, Yervant Zorian
2012 J jnl
A Pattern Generation Technique for Maximizing Switching Supply Currents Considering Gate Delays.
IEEE Trans. Computers
Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu
2012 J jnl
Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays.
IEEE Trans. Very Large Scale Integr. Syst.
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
2010 J jnl
An Efficient Technique for Leakage Current Estimation in Nanoscaled CMOS Circuits Incorporating Self-Loading Effects.
IEEE Trans. Computers
Alodeep Sanyal, Ashesh Rastogi, Wei Chen, Sandip Kundu
2010 J jnl
BIST to Detect and Characterize Transient and Parametric Failures.
IEEE Des. Test Comput.
Alodeep Sanyal, Syed M. Alam, Sandip Kundu
2010 A conf
RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage.
ITC
Alodeep Sanyal, Krishnendu Chakrabarty, Mahmut Yilmaz, Hideo Fujiwara
2009 — conf
A study on impact of aggressor de-rating in the context of multiple crosstalk effects in circuits.
ACM Great Lakes Symposium on VLSI
Alodeep Sanyal, Abhisek Pan, Sandip Kundu
2009 — conf
A study on impact of loading effect on capacitive crosstalk noise.
ISQED
Alodeep Sanyal, Abhisek Pan, Sandip Kundu
2009 J jnl
An Improved Soft-Error Rate Measurement Technique.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
2008 C conf
A Built-In Self-Test Scheme for Soft Error Rate Characterization.
IOLTS
Alodeep Sanyal, Syed M. Alam, Sandip Kundu
2008 — conf
A Built-in Test and Characterization Method for Circuit Marginality Related Failures.
ISQED
Alodeep Sanyal, Sandip Kundu
2008 J jnl
On Composite Leakage Current Maximization.
J. Electron. Test.
Ashesh Rastogi, Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu
2008 A conf
On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits.
DATE
Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu
2007 C conf
Accelerating Soft Error Rate Testing Through Pattern Selection.
IOLTS
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
2007 Misc conf
An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect.
VLSI Design
Ashesh Rastogi, Wei Chen, Alodeep Sanyal, Sandip Kundu
2007 — conf
On Accelerating Soft-Error Detection by Targeted Pattern Generation.
ISQED
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
2007 C conf
On Derating Soft Error Probability Based on Strength Filtering.
IOLTS
Alodeep Sanyal, Sandip Kundu
2006 C conf
A Pattern Generation Technique for Maximizing Power Supply Currents.
ICCD
Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu
2005 B conf
Dynamic power minimization during combinational circuit testing as a traveling salesman problem.
Congress on Evolutionary Computation
Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley, Yashwant K. Malaiya