Alfred L. Crouch

30 papers A* 1A 17Misc 3Journal 7Unranked 2

Year	Rank	Type	Title / Venue / Authors
2022	A	`conf`	IEEE P1687.1: Extending the Network Boundaries for Test. ITC Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo
2021	J	`jnl`	3D Ring Oscillator Based Test Structures to Detect a Trojan Die in a 3D Die Stack in the Presence of Process Variations. IEEE Trans. Emerg. Top. Comput. Soha Alhelaly, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Ping Gui, Alfred L. Crouch
2020	J	`jnl`	A role for embedded instrumentation in real-time hardware assurance and online monitoring against cybersecurity threats. IEEE Instrum. Meas. Mag. Alfred L. Crouch, Adam W. Ley
2020	A	`conf`	Modeling Novel Non-JTAG IEEE 1687-Like Architectures. ITC Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick
2019	Misc	`conf`	Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. VTS Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song
2019	Misc	`conf`	Innovative Practices on IEEE 1687.xyz. VTS Jeff Rearick, Alfred L. Crouch, Hans Martin von Staudt
2018	Misc	`conf`	Innovative practices on machine learning for emerging applications. VTS Kareem Madkour, Zhaobo Zhang, Alfred L. Crouch, Peter L. Levin, Eve Hunter, Yu Huang
2017	—	`conf`	Detecting a trojan die in 3D stacked integrated circuits. NATW Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch
2016	A*	`conf`	Invited - A box of dots: using scan-based path delay test for timing verification. DAC Alfred L. Crouch, John C. Potter
2014	A	`conf`	Board security enhancement using new locking SIB-based architectures. ITC Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter
2013	A	`conf`	BA-BIST: Board test from inside the IC out. ITC Zoe Conroy, Alfred L. Crouch
2013	J	`jnl`	FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System. IEEE Des. Test Alfred L. Crouch, John C. Potter, Ajay Khoche, Jennifer Dworak
2012	A	`conf`	Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. ITC Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers
2008	A	`conf`	The Advantages of Limiting P1687 to a Restricted Subset. ITC Jason Doege, Alfred L. Crouch
2007	J	`jnl`	A Production IR-Drop Screen on a Chip. IEEE Des. Test Comput. Zahi S. Abuhamdeh, Bob Hannagan, Jeff Remmers, Alfred L. Crouch
2007	A	`conf`	IJTAG: The path to organized instrument connectivity. ITC Alfred L. Crouch
2007	—	`conf`	Processing High Volume Scan Test Results for Yield Learning. ISQED Alfred L. Crouch, Phil Burlison, Dennis J. Ciplickas
2007	A	`conf`	Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip. ITC Zahi S. Abuhamdeh, Vincent D'Alassandro, Richard Pico, Dale Montrone, Alfred L. Crouch, Andrew Tracy
2006	A	`conf`	Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks. ITC Zahi S. Abuhamdeh, Philip Pears, Jeff Remmers, Alfred L. Crouch, Bob Hannagan
2004	A	`conf`	Future Trends in Test: The Adoption and Use of Low Cost Structural Testers. ITC Alfred L. Crouch
2003	J	`jnl`	AC Scan Path Selection for Physical Debugging. IEEE Des. Test Comput. Alfred L. Crouch, John C. Potter, Jason Doege
2002	A	`conf`	Testing the Tester: What Broke? Where? When? Why? ITC Alfred L. Crouch
2000	A	`conf`	Optimization trade-offs for vector volume and test power. ITC Bahram Pouya, Alfred L. Crouch
2000	J	`jnl`	Test Development for a Third-Version ColdFire Microprocessor. IEEE Des. Test Comput. Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran
1999	A	`conf`	The testability features of the 3rd generation ColdFire family of microprocessors. ITC Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran
1998	J	`jnl`	Test Development for Second-Generation ColdFire Microprocessors. IEEE Des. Test Comput. Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja
1997	A	`conf`	A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. ITC Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason
1994	A	`conf`	Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution. ITC Alfred L. Crouch, Rick Ramus, Colin M. Maunder
1994	A	`conf`	Testabilty Features of the MC 68060 Microprocessor. ITC Alfred L. Crouch, Matthew Pressly, Joe Circello
1989	A	`conf`	Prototype Testing Simplified by Scannable Buffers and Latches. ITC Andy Halliday, Greg Young, Alfred L. Crouch