Alexandre Sarafianos

16 papers C 4Journal 6Unranked 6
YearRankTypeTitle / Venue / Authors
2022 J jnl
Checking Robustness Against EM Side-Channel Attacks Prior to Manufacturing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Davide Poggi, Thomas Ordas, Alexandre Sarafianos, Philippe Maurine
2021 — conf
Protecting Secure ICs Against Side-Channel Attacks by Identifying and Quantifying Potential EM and Leakage Hotspots at Simulation Stage.
COSADE
Davide Poggi, Philippe Maurine, Thomas Ordas, Alexandre Sarafianos
2020 J jnl
Finding EM leakages at design stage: a simulation methodology.
IACR Cryptol. ePrint Arch.
Davide Poggi, Philippe Maurine, Thomas Ordas, Alexandre Sarafianos, Jérémy Raoult
2015 — conf
Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation.
IRPS
Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre
2015 J jnl
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation.
Microelectron. Reliab.
Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos
2015 C conf
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents.
IOLTS
Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos
2015 — conf
Influence of triple-well technology on laser fault injection and laser sensor efficiency.
DFTS
Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre
2015 C conf
Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses.
IOLTS
Marc Lacruche, Nicolas Borrel, Clement Champeix, Cyril Roscian, Alexandre Sarafianos, Jean-Baptiste Rigaud, Jean-Max Dutertre, Edith Kussener
2015 — conf
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology.
DFTS
Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos
2014 J jnl
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS.
Microelectron. Reliab.
Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos
2014 — conf
Laser attacks on integrated circuits: From CMOS to FD-SOI.
DTIS
Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale
2014 C conf
Laser-induced fault effects in security-dedicated circuits.
VLSI-SoC
Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier
2013 J jnl
Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell.
Microelectron. Reliab.
Alexandre Sarafianos, Cyril Roscian, Jean-Max Dutertre, Mathieu Lisart, Assia Tria
2013 C conf
Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells.
FDTC
Cyril Roscian, Alexandre Sarafianos, Jean-Max Dutertre, Assia Tria
2013 — conf
Robustness improvement of an SRAM cell against laser-induced fault injection.
DFTS
Alexandre Sarafianos, Mathieu Lisart, Olivier Gagliano, Valerie Serradeil, Cyril Roscian, Jean-Max Dutertre, Assia Tria
2012 J jnl
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.
Microelectron. Reliab.
Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis