Alexandre Boyer

37 papers C 1Journal 20Unranked 15
YearRankTypeTitle / Venue / Authors
2024 — conf
Accelerated characterisation of Operational Amplifiers' susceptibility using multitone disturbance.
EMC Compo
Matthieu Laidet, Alexandre Boyer, Julien Gazave, Sonia Ben Dhia
2022 — —
Contributions to Computing needs in High Energy Physics Offline Activities: Towards an efficient exploitation of heterogeneous, distributed and shared Computing Resources. (Contributions aux besoins informatiques dans les activités hors-ligne du domaine de la Physique des Hautes-Énergies: Vers une exploitation efficace de ressources de calcul partagées, hétérogènes et distribuées).
Alexandre Boyer
2021 J jnl
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes.
IEEE Trans. Instrum. Meas.
Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia
2021 — conf
Vessel Identification using Convolutional Neural Network-based Hardware Accelerators.
CIVEMSA
Alexandre Boyer, Rami S. Abielmona, Miodrag Bolic, Emil M. Petriu
2019 — conf
Detecting PCB Assembly Defects Using Infrared Thermal Signatures.
MIXDES
Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard
2018 J jnl
New defect detection approach using near electromagnetic field probing of high density PCBAs.
Microelectron. Reliab.
Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard
2018 — conf
New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs.
NATW
Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard
2018 J jnl
Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis.
J. Electron. Test.
Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard
2015 J jnl
A methodologic project to characterize and model COTS component reliability.
Microelectron. Reliab.
André Durier, Alain Bensoussan, Moustafa Zerarka, Chaimae Ghfiri, Alexandre Boyer, Hélène Frémont
2015 J jnl
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter.
Microelectron. Reliab.
He Huang, Alexandre Boyer, Sonia Bendhia
2015 — conf
Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs.
EMC Compo
Veljko Tomasevic, Alexandre Boyer, Sonia Ben Dhia
2015 — conf
Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions.
EMC Compo
Abhishek Ramanujan, Etienne Sicard, Alexandre Boyer, Jean-Luc Levant, Christian Marot, Frédéric Lafon
2015 — conf
EMC performance analysis of a processor/memory system using PCB and Package-On-Package.
EMC Compo
Etienne Sicard, Alexandre Boyer, Priscila Fernandez-Lopez, An Zhou, Nicolas Marier, Frédéric Lafon
2015 J jnl
Electronic counterfeit detection based on the measurement of electromagnetic fingerprint.
Microelectron. Reliab.
He Huang, Alexandre Boyer, Sonia Ben Dhia
2015 — conf
Enhancement of the spatial resolution of near-field immunity maps.
EMC Compo
Alexandre Boyer, M. Cavarroc
2014 — conf
Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing.
LATW
Sonia Ben Dhia, Alexandre Boyer
2014 J jnl
Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits.
J. Low Power Electron.
Alexandre Boyer, Sonia Ben Dhia
2014 C conf
Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI).
VLSI-SoC
Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, Karim Tobich, Alexandre Boyer, Bertrand Vrignon, John Shepherd, Thanh-Ha Le, Maël Berthier, Lionel Rivière, Bruno Robisson, Anne-Lise Ribotta
2013 — conf
Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission.
EMC Compo
Alexandre Boyer, Sonia Ben Dhia
2013 — conf
Effect of aging on power integrity of digital integrated circuits.
LATW
Alexandre Boyer, Sonia Ben Dhia
2013 — conf
Electro-magnetic robustness of integrated circuits: from statement to prediction.
EMC Compo
Sonia Ben Dhia, Alexandre Boyer
2013 J jnl
LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing.
Microelectron. Reliab.
Jianfei Wu, Alexandre Boyer, Jiancheng Li, Sonia Bendhia, Bertrand Vrignon
2013 J jnl
Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project.
Microelectron. Reliab.
Sonia Ben Dhia, Alexandre Boyer
2013 — conf
Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI.
EMC Compo
C. Oliveira, Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez, Alexandre Boyer
2012 J jnl
IC Immunity Modeling Process Validation Using On-Chip Measurements.
J. Electron. Test.
Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro
2012 J jnl
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations.
IEEE Trans. Instrum. Meas.
Sonia Bendhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro, Thanh Vinh Dinh
2012 J jnl
Prediction of Long-term Immunity of a Phase-Locked Loop.
J. Electron. Test.
Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon
2011 J jnl
A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior.
IEICE Trans. Electron.
Raúl Fernández-García, Ignacio Gil, Alexandre Boyer, Sonia Bendhia, Bertrand Vrignon
2011 J jnl
Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout.
Microelectron. Reliab.
Néstor Berbel, Raúl Fernández-García, Ignacio Gil, Binhong Li, Alexandre Boyer, Sonia Bendhia
2011 — conf
IC immunity modeling process validation using on-chip measurements.
LATW
Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro
2011 J jnl
Integrated Circuit Emission Model Extraction with a Fuzzy Logic System.
Int. J. Fuzzy Syst. Appl.
Tsung-Chih Lin, Ming-Jen Kuo, Alexandre Boyer
2011 — conf
Prediction of long-term immunity of a phase-locked loop.
LATW
Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon
2011 J jnl
Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences.
Microelectron. Reliab.
Binhong Li, Néstor Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García
2010 J jnl
Ageing effect on electromagnetic susceptibility of a phase locked loop.
Microelectron. Reliab.
Binhong Li, Alexandre Boyer, Sonia Bendhia, Christophe Lemoine
2008 J jnl
Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits.
Microelectron. J.
Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, Mohammed Ramdani, Etienne Sicard, M'hamed Drissi
2003 J jnl
Design of a micromachined thermal accelerometer: thermal simulation and experimental results.
Microelectron. J.
Frédérick Mailly, Augustin Martinez, Alain Giani, Frédérique Pascal-Delannoy, Alexandre Boyer
2003 J jnl
Electrical properties of zinc oxide sputtered thin films.
Microelectron. J.
R. Ondo-Ndong, G. Ferblantier, Frédérique Pascal-Delannoy, Alexandre Boyer, A. Foucaran