Alexandra L. Zimpeck

41 papers C 11Journal 10Unranked 20
YearRankTypeTitle / Venue / Authors
2024 J jnl
Guest Editorial Special Issue on the IEEE Latin American Symposium on Circuits and Systems (LASCAS 2023).
IEEE Trans. Circuits Syst. I Regul. Pap.
Alexandra L. Zimpeck, Alexander Fish
2023 — conf
A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures.
SBCCI
Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra, Paulo F. Butzen, Cristina Meinhardt
2023 J jnl
An Approach to Remote Update Embedded Systems in the Internet of Things.
J. Internet Serv. Appl.
Cleber S. Peter, Lucas Penning, Alexandra L. Zimpeck, Felipe Marques, Adenauer C. Yamin
2023 — conf
Fast and Low-Error Prediction of Logic Gate Cell Characterization.
ICECS
Gabriel Lima Jacinto, Cínthia Schneider, Alexandra L. Zimpeck, Mateus Grellert, Cristina Meinhardt
2023 C conf
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation.
ISCAS
Bernardo Borges Sandoval, Leonardo Heitich Brendler, Fernanda Lima Kastensmidt, Ricardo Reis, Alexandra L. Zimpeck, Rafael B. Schvittz, Cristina Meinhardt
2023 J jnl
Robustness Analysis of 3-2 Adder Compressor Designed in 7-nm FinFET Technology.
IEEE Trans. Circuits Syst. II Express Briefs
Gerson D. Andrade, Matheus Silva, Cínthia Schneider, Guilherme Paim, Sergio Bampi, Eduardo Costa, Alexandra L. Zimpeck
2022 J jnl
Exploring XOR-based Full Adders and decoupling cells to variability mitigation at FinFET technology.
Integr.
Fábio G. R. G. da Silva, Rafael N. M. Oliveira, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
2021 — conf
Current Behavior on Process Variability Aware FinFET Inverter Designs.
LASCAS
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
2021 — conf
Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study.
LATS
Bernardo Borges Sandoval, Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis, Cristina Meinhardt
2021 — conf
Sensitivity of FinFET Adders to PVT Variations and Sleep Transistor as a Mitigation Strategy.
APCCAS
Gerson D. Andrade, Ricardo A. L. Reis, Eduardo A. C. da Costa, Alexandra L. Zimpeck
2021 — conf
Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit.
LASCAS
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis
2020 — conf
Circuit Level Design Methods to Mitigate Soft Errors.
LATS
Ricardo A. L. Reis, Cristina Meinhardt, Alexandra L. Zimpeck, Leonardo Heitich Brendler, Leonardo B. Moraes
2020 J jnl
Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology.
IEEE Trans. Circuits Syst. I Regul. Pap.
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
2020 C conf
Pros and Cons of ST and SIG FinFET Inverters for Low Power Designs.
ISCAS
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
2020 — conf
Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters.
LATS
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
2019 C conf
Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs.
VLSI-SoC
Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis
2019 C conf
Evaluation of SET under Process Variability on FinFET Multi-level Design.
VLSI-SoC
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis
2019 — conf
Exploring Schmitt Trigger Circuits for Process Variability Mitigation.
NEWCAS
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
2019 C conf
Impact of Process Variability and Single Event Transient on FinFET Technology.
VLSI-SoC
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis
2019 C conf
Minimum Energy FinFET Schmitt Trigger Design Considering Process Variability.
VLSI-SoC
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
2019 — conf
Process Variability Impact on the SET Response of FinFET Multi-level Design.
VLSI-SoC (Selected Papers)
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
2019 C conf
Robustness and Minimum Energy-Oriented FinFET Design.
VLSI-SoC
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
2019 — conf
Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility.
ICECS
Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis
2018 C conf
Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements.
VLSI-SoC
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
2018 J jnl
Evaluation of variability using Schmitt trigger on full adders layout.
Microelectron. Reliab.
Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
2018 — conf
Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells.
ICECS
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
2018 J jnl
Impact of different transistor arrangements on gate variability.
Microelectron. Reliab.
Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis
2018 C conf
Pros and Cons of Schmitt Trigger Inverters to Mitigate PVT Variability on Full Adders.
ISCAS
Samuel Presa Toledo, Alexandra L. Zimpeck, Ricardo Reis, Cristina Meinhardt
2017 — conf
Impact of schmitt trigger inverters on process variability robustness of 1-Bit full adders.
ICECS
Samuel Presa Toledo, Alexandra L. Zimpeck, Ricardo Reis, Cristina Meinhardt
2017 C conf
Robustness of Sub-22nm multigate devices against physical variability.
ISCAS
Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis
2017 — conf
Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices.
ICECS
Ygor Q. Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis
2016 C conf
FinFET cells with different transistor sizing techniques against PVT variations.
ISCAS
Alexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Augusto da Luz Reis
2016 — conf
Geometric variability impact on 7nm Trigate combinational cells.
ICECS
Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis
2016 — conf
Impact of variability effects on FinFET transistors and combinational cells.
ICECS
Alexandra L. Zimpeck, Ricardo Reis
2016 J jnl
Permanent and single event transient faults reliability evaluation EDA tool.
Microelectron. Reliab.
Y. Q. de Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
2015 — conf
Analyzing the Impact of Frequency and Diverse Path Delays in the Time Vulnerability Factor of Master-Slave D Flip-Flops.
ISVLSI
Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis
2015 J jnl
Impact of PVT variability on 20 nm FinFET standard cells.
Microelectron. Reliab.
Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
2015 — conf
Process variability in FinFET standard cells with different transistor sizing techniques.
ICECS
Alexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Reis
2014 — conf
Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices.
PATMOS
Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
2014 — conf
Impact of gate workfunction fluctuation on FinFET standard cells.
ICECS
Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo Augusto da Luz Reis
2014 J jnl
Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations.
Microelectron. Reliab.
Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo A. L. Reis