Alexander Albicki

21 papers A* 1A 2B 1C 8Misc 1Journal 5Unranked 3
YearRankTypeTitle / Venue / Authors
1996 J jnl
Extended hyperbolic congruential frequency hop code: generation and bounds for cross- and auto-ambiguity function.
IEEE Trans. Commun.
Leszek D. Wronski, Razak Hossain, Alexander Albicki
1996 J jnl
Reducing power dissipation in CMOS circuits by signal probability based transistor reordering.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Razak Hossain, Menghui Zheng, Alexander Albicki
1995 C conf
Efficient testability enhancement for combinational circuit.
ICCD
Yu Fang, Alexander Albicki
1995 C conf
Low power and high speed multiplication design through mixed number representations.
ICCD
Menghui Zheng, Alexander Albicki
1994 J jnl
High Throughput Error Control Using Parallel CRC.
VLSI Design
Andrzej Sobski, Alexander Albicki
1994 J jnl
Low power design using double edge triggered flip-flops.
IEEE Trans. Very Large Scale Integr. Syst.
Razak Hossain, Leszek D. Wronski, Alexander Albicki
1994 Misc conf
New advances in path delay fault testing of combinational circuits.
VTS
Xiaodong Xie, Alexander Albicki
1994 C conf
Reducing Power Dissipation in Serially Connected MOSFET Circuits via Transistor Reordering.
ICCD
Razak Hossain, Menghui Zheng, Alexander Albicki
1993 C conf
Bit-Splitting for Testability Enhancement in Scan-Based Design.
ICCD
Xiaodong Xie, Alexander Albicki
1993 C conf
Double Edge Triggered Devices: Speed and Power Considerations.
ISCAS
Razak Hossain, Leszek D. Wronski, Alexander Albicki
1993 — conf
Locally clocked microprocessor.
Great Lakes Symposium on VLSI
Stephen J. Muscato, Alexander Albicki
1992 — conf
An asynchronous multiplier.
Great Lakes Symposium on VLSI
Brenda Luderman, Alexander Albicki
1992 C conf
Design of Robust-Path-Delay-Fault-Testable Combinational Circuits by Boolean Space Expansion.
ICCD
Xiaodong Xie, Alexander Albicki, Andrzej Krasniewski
1992 — conf
Self-timed pipeline with adder.
Great Lakes Symposium on VLSI
John Compton, Alexander Albicki
1991 C conf
Random Testability of Redundant Circuits.
ICCD
Andrzej Krasniewski, Alexander Albicki
1989 C conf
An algorithm for voice and data integration on packet-switched local area networks.
ICCD
Christopher Bucci, Alexander Albicki
1989 J jnl
Comments on "Ternary Scan Design for VLSI Testability".
IEEE Trans. Computers
Robert F. Molyneaux, Alexander Albicki
1988 B conf
Prioritized access in CSMA networks: a node partitioning approach.
LCN
Rajiv Arora, Alexander Albicki
1985 A conf
Automatic Design of Exhaustively Self-Testing Chips with Bilbo Modules.
ITC
Andrzej Krasniewski, Alexander Albicki
1985 A conf
Evaluation ot Monitor Complexity for Concurrently Testing Microprogrammed Control Units.
ITC
Carl Staelin, Alexander Albicki
1985 A* conf
Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications.
DAC
Andrzej Krasniewski, Alexander Albicki