Alessandro Motta

13 papers A 1Misc 1Journal 5Unranked 6
YearRankTypeTitle / Venue / Authors
2024 J jnl
Handling Geometric Domain Shifts in Semantic Segmentation of Surgical RGB and Hyperspectral Images.
CoRR
Silvia Seidlitz, Jan Sellner, Alexander Studier-Fischer, Alessandro Motta, Berkin Özdemir, Beat P. Müller-Stich, Felix Nickel, Lena Maier-Hein
2024 J jnl
Test-time augmentation with synthetic data addresses distribution shifts in spectral imaging.
Int. J. Comput. Assist. Radiol. Surg.
Ahmad Bin Qasim, Alessandro Motta, Alexander Studier-Fischer, Jan Sellner, Leonardo Ayala, Marco Hübner, Marc Bressan, Berkin Özdemir, Karl-Friedrich Kowalewski, Felix Nickel, Silvia Seidlitz, Lena Maier-Hein
2023 — conf
Semantic Segmentation of Surgical Hyperspectral Images Under Geometric Domain Shifts.
MICCAI (9)
Jan Sellner, Silvia Seidlitz, Alexander Studier-Fischer, Alessandro Motta, Berkin Özdemir, Beat Peter Müller-Stich, Felix Nickel, Lena Maier-Hein
2023 J jnl
Semantic segmentation of surgical hyperspectral images under geometric domain shifts.
CoRR
Jan Sellner, Silvia Seidlitz, Alexander Studier-Fischer, Alessandro Motta, Berkin Özdemir, Beat Peter Müller-Stich, Felix Nickel, Lena Maier-Hein
2023 — conf
ePCM reliability improvement through active material carbon implantation.
ESSDERC
Elisabetta Palumbo, Alessandro Motta, Elisa Petroni, Daniele Gallinari, Annalisa Gilardini, Amos Galbiati, Massimo Borghi, Roberto Annunziata, Andrea Redaelli
2022 — conf
Assessing User Privacy on Social Media: The Twitter Case Study.
OASIS@HT
Giovanni Livraga, Alessandro Motta, Marco Viviani
2022 — conf
Characterization of reset state through energy activation study in Ge-GST based ePCM.
ESSDERC
Matteo Baldo, Lorenzo Turconi, Alessandro Motta, Elisa Petroni, Luca Laurin, Daniele Ielmini, Andrea Redaelli
2018 — conf
A fully contactless wafer-level testing for UHF RFID tag with on-chip antenna.
DTIS
Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano
2018 J jnl
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In.
J. Low Power Electron.
Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini
2018 — conf
Main Parasitic Effects in Contactless Wafer Testing.
ApplePies
Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano
2018 J jnl
Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas.
IEEE Trans. Circuits Syst. II Express Briefs
Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Egidio Ragonese, Giuseppe Palmisano
2017 A conf
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC.
DATE
Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini
2016 Misc conf
Thermal issues in test: An overview of the significant aspects and industrial practice.
VTS
Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser