Albert Theuwissen

26 papers C 2Journal 5Unranked 18
YearRankTypeTitle / Venue / Authors
2023 J jnl
A CMOS Image Sensor Dark Current Compensation Using In-Pixel Temperature Sensors.
Sensors
Accel Abarca, Albert Theuwissen
2023 — conf
A linearity improvement method for CIS column-parallel SAR ADC using two-step conversion.
ESSCIRC
Jaekyum Lee, Albert Theuwissen
2022 — conf
An offset calibration technique for CIS column-parallel SAR ADCs using memory.
Imaging Sensors and Systems
Jaekyum Lee, Albert Theuwissen
2021 — conf
1.4 There's More to the Picture Than Meets the Eye*, and in the future it will only become more so.
ISSCC
Albert Theuwissen
2020 J jnl
A 10 Bit 5 MS/s Column SAR ADC With Digital Error Correction for CMOS Image Sensors.
IEEE Trans. Circuits Syst. II Express Briefs
Shuang Xie, Albert Theuwissen
2020 J jnl
A CMOS image sensor with a 10 ​MHz column readout speed using digitally calibrated pipelined ADCs.
Microelectron. J.
Shuang Xie, Albert Theuwissen
2020 J jnl
A CMOS-Imager-Pixel-Based Temperature Sensor for Dark Current Compensation.
IEEE Trans. Circuits Syst. II Express Briefs
Shuang Xie, Accel Abarca Prouza, Albert Theuwissen
2019 C conf
A CMOS Image Sensor with Improved Readout Speed using Column SAR ADC with Digital Error Correction.
ISCAS
Shuang Xie, Albert Theuwissen
2019 J jnl
Compensation for Process and Temperature Dependency in a CMOS Image Sensor.
Sensors
Shuang Xie, Albert Theuwissen
2019 C conf
Temperature Sensors Incorporated into a CMOS Image Sensor with Column Zoom ADCs.
ISCAS
Shuang Xie, Xiaoliang Ge, Albert Theuwissen
2018 — conf
Two calibration methods to improve the linearity of a CMOS image sensor.
IMSE
Fei Wang, Albert Theuwissen
2017 — conf
Analysis and calibration of process variations for an array of temperature sensors.
IEEE SENSORS
Shuang Xie, Accel Abarca, Jules Markenhof, Xiaoliang Ge, Albert Theuwissen
2017 — conf
Linearity analysis of a CMOS image sensor.
IMSE
Fei Wang, Albert Theuwissen
2016 — conf
A CMOS image sensor with nearly unity-gain source follower and optimized column amplifier.
IEEE SENSORS
Xiaoliang Ge, Albert Theuwissen
2016 — conf
A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique.
IMSE
Xiaoliang Ge, Bastien Mamdy, Albert Theuwissen
2014 — conf
F2: 3D stacking technologies for image sensors and memories.
ISSCC
Yusuke Oike, Makoto Ikeda, Albert Theuwissen, Johannes Solhusvik, Jonathan Chang, Tadahiro Kuroda
2013 — book
A Biologically Inspired CMOS Image Sensor
Mukul Sarkar, Albert Theuwissen
2013 — conf
F4: Scientific imaging.
ISSCC
Makoto Ikeda, Ehsan Afshari, Yusuke Oike, David Ruffieux, Johannes Solhusvik, Albert Theuwissen
2012 — conf
A 0.7e
ISSCC
Yue Chen, Yang Xu, Youngcheol Chae, Adri Mierop, Xinyang Wang, Albert Theuwissen
2012 — conf
Computational imaging.
ISSCC
Makoto Ikeda, Albert Theuwissen, Johannes Solhusvik, Jan T. Bosiers
2011 — conf
Image sensors for 3D capture.
ISSCC
Johannes Solhusvik, Albert Theuwissen, Sam Kavusi, Tetsuo Nomoto, Iliana Chen
2008 — conf
Highlights of IEDM 2007.
ISSCC
Albert Theuwissen, Roland Thewes, Ernesto Perea
2008 — conf
Wide Dynamic Range Imaging (Forum).
ISSCC
Albert Theuwissen
2007 — conf
CMOS image sensors: State-of-the-art and future perspectives.
ESSCIRC
Albert Theuwissen
2007 — conf
SE5 Highlights of IEDM 2006.
ISSCC
Albert Theuwissen, Ernesto Perea
2006 — conf
A CMOS Imager with Column-Level ADC Using Dynamic Column FPN Reduction.
ISSCC
Martijn F. Snoeij, Albert Theuwissen, Kofi A. A. Makinwa, Johan H. Huijsing