Akira Nishiyama

14 papers Journal 10Unranked 4
YearRankTypeTitle / Venue / Authors
2023 J jnl
Process Planning with Removal of Melting Penetration and Temper Colors in 5-Axis Hybrid Additive and Subtractive Manufacturing.
Int. J. Autom. Technol.
Akira Nishiyama, Shun Kayashima, Nobuyuki Sumi, Takashi Hashimoto, Takeyuki Abe, Jun'ichi Kaneko
2021 — conf
Infrared Emission Spectroscopic Imaging of Microplastics Using Long-Wavelength Infrared Hyperspectral Camera with Imaging-Type Two-Dimensional Fourier Spectroscopy.
WHISPERS
Kosuke Nogo, Kou Ikejima, Wei Qi, Tomoya Kitazaki, Hiroshi Kanasaki, Kazushi Hamada, Kenji Wada, Akira Nishiyama, Ichiro Ishimaru
2015 J jnl
Electron transport mechanism of tungsten trioxide powder thin film studied by investigating effect of annealing on resistivity.
Microelectron. Reliab.
Wei Li, Akito Sasaki, Hideyuki Oozu, Katsuaki Aoki, Kuniyuki Kakushima, Yoshinori Kataoka, Akira Nishiyama, Nobuyuki Sugii, Hitoshi Wakabayashi, Kazuo Tsutsui, Kenji Natori, Hiroshi Iwai
2015 J jnl
Improvement of charge/discharge performance for lithium ion batteries with tungsten trioxide electrodes.
Microelectron. Reliab.
Wei Li, Akito Sasaki, Hideyuki Oozu, Katsuaki Aoki, Kuniyuki Kakushima, Yoshinori Kataoka, Akira Nishiyama, Nobuyuki Sugii, Hitoshi Wakabayashi, Kazuo Tsutsui, Kenji Natori, Hiroshi Iwai
2014 J jnl
A novel hetero-junction Tunnel-FET using Semiconducting silicide-Silicon contact and its scalability.
Microelectron. Reliab.
Yan Wu, Hiroyuki Hasegawa, Kuniyuki Kakushima, Kenji Ohmori, Takanobu Watanabe, Akira Nishiyama, Nobuyuki Sugii, Hitoshi Wakabayashi, Kazuo Tsutsui, Yoshinori Kataoka, Kenji Natori, Keisaku Yamada, Hiroshi Iwai
2014 J jnl
Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement.
Microelectron. Reliab.
Chunmeng Dou, Tomoya Shoji, Kazuhiro Nakajima, Kuniyuki Kakushima, Parhat Ahmet, Yoshinori Kataoka, Akira Nishiyama, Nobuyuki Sugii, Hitoshi Wakabayashi, Kazuo Tsutsui, Kenji Natori, Hiroshi Iwai
2014 J jnl
Chromatin Properties of Regulatory DNA Probed by Manipulation of Transcription Factors.
J. Comput. Biol.
Alexei A. Sharov, Akira Nishiyama, Yong Qian, Dawood B. Dudekula, Dan L. Longo, David Schlessinger, Minoru S. H. Ko
2013 — conf
Advantage of TiN Schottky gate over conventional Ni for improved electrical characteristics in AlGaN/GaN HEMT.
ESSDERC
Takamasa Kawanago, Kuniyuki Kakushima, Yoshinori Kataoka, Akira Nishiyama, Nobuyuki Sugii, Hitoshi Wakabayashi, Kazuo Tsutsui, Kenji Natori, Hiroshi Iwai
2013 — conf
Precision Controlled Variable Phase Filter for Imaging Type Two-Dimensional Spectroscopic Tomography.
SocialCom
Pradeep Kumara Wijesekara Abeygunawardhana, Satoru Suzuki, Ichirou Ishimaru, Akira Nishiyama
2012 — conf
(100)- and (110)-oriented nMOSFETs with highly scaled EOT in La-silicate/Si interface for multi-gate architecture.
ESSDERC
Takamasa Kawanago, Kuniyuki Kakushima, Parhat Ahmet, Yoshinori Kataoka, Akira Nishiyama, Nobuyuki Sugii, Kazuo Tsutsui, Kenji Natori, Takeo Hattori, Hiroshi Iwai
2012 J jnl
Oxide and interface trap densities estimation in ultrathin W/La
Microelectron. Reliab.
M. Mamatrishat, T. Kubota, T. Seki, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Yoshinori Kataoka, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai
2012 J jnl
Resistive switching behavior of a CeO
Microelectron. Reliab.
Chunmeng Dou, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai
2011 J jnl
Effects of La
Microelectron. Reliab.
D. Zade, Soshi Sato, Kuniyuki Kakushima, A. Srivastava, Parhat Ahmet, Kazuo Tsutsui, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Chandan Kumar Sarkar, Hiroshi Iwai
1988 J jnl
An optimized 1.0- mu m CMOS technology for next-generation channelless gate arrays.
IEEE J. Solid State Circuits
Yukihiro Ushiku, Teruo Kobayashi, Akito Yoshida, Nobuyuki Itoh, Akira Nishiyama, Rempei Nakata