Ajay Khoche

24 papers A 7Misc 9Journal 4Unranked 4
YearRankTypeTitle / Venue / Authors
2013 J jnl
FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System.
IEEE Des. Test
Alfred L. Crouch, John C. Potter, Ajay Khoche, Jennifer Dworak
2010 A conf
STIL P1450.4: A standard for test flow specification.
ITC
Jim O'Reilly, Ajay Khoche, Ernst Wahl, Bruce R. Parnas
2009 Misc conf
STDF Memory Fail Datalog Standard.
VTS
Ajay Khoche, Jay Katz, Sauro Landini, Kochen Liao, Neetu Agrawal, Glenn Plowman, Songlin Zuo, Liyang Lai, John Rowe, Thomas Zanon
2008 A conf
A Tutorial on STDF Fail Datalog Standard.
ITC
Ajay Khoche, Phil Burlison, John Rowe, Glenn Plowman
2006 J jnl
Panel Summaries: Real-Time Volume Diagnostics--Requirements and Challenges.
IEEE Des. Test Comput.
Ajay Khoche
2006 A conf
Selective and Accurate Fail Data Capture in Compression Environment for Volume Diagnostics.
ITC
Ajay Khoche, Domenico Chindamo, Michael Braun, Martin Fischer
2006 Misc conf
Session Abstract.
VTS
Ajay Khoche
2006 Misc conf
Session Abstract.
VTS
Ajay Khoche, Peter Muhmenthaler
2006 Misc conf
Session Abstract.
VTS
Ajay Khoche, Mike Rodgers, Pete O'Neil
2006 — conf
The Next Step in Volume Scan Diagnosis: Standard Fail Data Format.
ATS
Andreas Leininger, Ajay Khoche, Martin Fischer, Nagesh Tamarapalli, Wu-Tung Cheng, Randy Klingenberg, Wu Yang
2003 J jnl
Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits.
J. Electron. Test.
Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges
2002 A conf
Packet-Based Input Test Data Compression Techniques.
ITC
Erik H. Volkerink, Ajay Khoche, Subhasish Mitra
2002 Misc conf
Test Economics for Multi-site Test with Modern Cost Reduction Techniques.
VTS
Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges
2002 Misc conf
Test Vector Compression Using EDA-ATE Synergies.
VTS
Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra
2001 A conf
A new methodology for improved tester utilization.
ITC
Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir
2001 A conf
Tackling test trade-offs from design, manufacturing to market using economic modeling.
ITC
Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff
1997 A conf
ACT: A DFT Tool for Self-Timed Circuits.
ITC
Ajay Khoche, Erik Brunvand
1997 Misc conf
Critical hazard free test generation for asynchronous circuits.
VTS
Ajay Khoche, Erik Brunvand
1995 Misc conf
A partial scan methodology for testing self-timed circuits.
VTS
Ajay Khoche, Erik Brunvand
1995 — conf
DFT for fast testing of self-timed control circuits.
Asian Test Symposium
Sandeep Pagey, Ajay Khoche, Erik Brunvand
1995 — conf
Testing self-timed circuits using partial scan.
ASYNC
Ajay Khoche, Erik Brunvand
1994 — conf
Testing micropipelines.
ASYNC
Ajay Khoche, Erik Brunvand
1992 Misc conf
A Behavioral Fault Simulator For Ideal.
VLSI Design
Ajay Khoche, Sunil D. Sherlekar, G. Venkatesh
1992 J jnl
A Behavioral Fault Simulator for Ideal.
IEEE Des. Test Comput.
Ajay Khoche, Sunil D. Sherlekar, G. Venkatesh, Raja Venkateswaran