| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2013 | J | jnl |
IEEE Des. Test
|
| 2010 | A | conf |
ITC
|
| 2009 | Misc | conf |
VTS
|
| 2008 | A | conf |
ITC
|
| 2006 | J | jnl |
IEEE Des. Test Comput.
|
| 2006 | A | conf |
ITC
|
| 2006 | Misc | conf |
VTS
|
| 2006 | Misc | conf |
VTS
|
| 2006 | Misc | conf |
VTS
|
| 2006 | — | conf |
ATS
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2002 | A | conf |
ITC
|
| 2002 | Misc | conf |
VTS
|
| 2002 | Misc | conf |
VTS
|
| 2001 | A | conf |
ITC
|
| 2001 | A | conf |
ITC
|
| 1997 | A | conf |
ITC
|
| 1997 | Misc | conf |
VTS
|
| 1995 | Misc | conf |
VTS
|
| 1995 | — | conf |
Asian Test Symposium
|
| 1995 | — | conf |
ASYNC
|
| 1994 | — | conf |
ASYNC
|
| 1992 | Misc | conf |
VLSI Design
|
| 1992 | J | jnl |
IEEE Des. Test Comput.
|