| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Open J. Commun. Soc.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Microprocess. Microsystems
|
| 2021 | J | jnl |
Integr.
|
| 2018 | J | jnl |
J. Circuits Syst. Comput.
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
A probabilistic pairwise swap search state assignment algorithm for sequential circuit optimization.
Integr.
|
| 2017 | J | jnl |
Integr.
|
| 2017 | J | jnl |
IET Comput. Digit. Tech.
|
| 2016 | J | jnl |
Appl. Intell.
|
| 2016 | J | jnl |
IET Comput. Digit. Tech.
|
| 2015 | — | conf |
ISSPIT
|
| 2015 | J | jnl |
IEEE Trans. Reliab.
|
| 2015 | J | jnl |
Comput. Electr. Eng.
|
| 2015 | — | conf |
ISSPIT
|
| 2015 | J | jnl |
J. Circuits Syst. Comput.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
Appl. Soft Comput.
|
| 2013 | — | conf |
ISED
|
| 2010 | J | jnl |
Comput. Electr. Eng.
|
| 2009 | J | jnl |
IET Comput. Digit. Tech.
|
| 2009 | J | jnl |
IET Comput. Digit. Tech.
|
| 2008 | J | jnl |
IET Comput. Digit. Tech.
|
| 2008 | J | jnl |
IET Comput. Digit. Tech.
|
| 2008 | C | conf |
AICCSA
|
| 2007 | — | conf |
ATS
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2006 | C | conf |
ISCAS
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2004 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | — | conf |
ICECS
|
| 2003 | — | conf |
A static test compaction technique for combinational circuits based on independent fault clustering.
ICECS
|
| 2003 | Misc | conf |
VTS
|
| 2003 | — | conf |
ICECS
|
| 2003 | — | conf |
ISCAS (5)
|
| 2003 | — | conf |
ISCAS (5)
|
| 2003 | — | conf |
ISCAS (5)
|
| 2003 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2002 | — | conf |
ICECS
|
| 2001 | — | conf |
ISCAS (4)
|
| 2001 | C | conf |
ICCD
|
| 1998 | A* | conf |
DAC
|
| 1997 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1996 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1995 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1995 | A* | conf |
DAC
|
| 1995 | J | jnl |
IEEE Des. Test Comput.
|