Aida Todri

35 papers A 7B 5C 6Misc 2Journal 5Unranked 10
YearRankTypeTitle / Venue / Authors
2023 J jnl
How fast can vanadium dioxide neuron-mimicking devices oscillate? Physical mechanisms limiting the frequency of vanadium dioxide oscillators.
Neuromorph. Comput. Eng.
Stefania Carapezzi, Andrew Plews, Gabriele Boschetto, Ahmed Nejim, Siegfried F. Karg, Aida Todri
2014 C conf
Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults.
DDECS
Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri
2014 C conf
Test and diagnosis of power switches.
DDECS
Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot
2014 B conf
iBoX - Jitter based Power Supply Noise sensor.
ETS
Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot
2013 J jnl
A Study of Tapered 3-D TSVs for Power and Thermal Integrity.
IEEE Trans. Very Large Scale Integr. Syst.
Aida Todri, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo, Arnaud Virazel
2013 Misc conf
A built-in scheme for testing and repairing voltage regulators of low-power srams.
VTS
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 — conf
Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing.
Asian Test Symposium
Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 B conf
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability.
ETS
Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 — conf
Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures.
DTIS
Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 — conf
Effect-cause intra-cell diagnosis at transistor level.
ISQED
Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Etienne Auvray
2013 — conf
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.
DFTS
Elena I. Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné
2013 A conf
On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs.
ITC
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 C conf
SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations.
IOLTS
Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné
2013 A conf
Test solution for data retention faults in low-power SRAMs.
DATE
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 J jnl
Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation.
IEEE Trans. Very Large Scale Integr. Syst.
Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel
2012 Misc conf
A pseudo-dynamic comparator for error detection in fault tolerant architectures.
VTS
D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Michael E. Imhof, Hans-Joachim Wunderlich
2012 B conf
Coupling-based resistive-open defects in TAS-MRAM architectures.
ETS
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay
2012 B conf
Defect analysis in power mode control logic of low-power SRAMs.
ETS
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2012 C conf
Evaluation of test algorithms stress effect on SRAMs under neutron radiation.
IOLTS
Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné
2012 — conf
Impact of Resistive-Bridge Defects in TAS-MRAM Architectures.
Asian Test Symposium
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay
2012 A conf
Low-power SRAMs power mode control logic: Failure analysis and test solutions.
ITC
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2012 — conf
Power Supply Noise Sensor Based on Timing Uncertainty Measurements.
Asian Test Symposium
Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, P. Debaud, S. Guilhot
2012 B conf
Through-Silicon-Via resistive-open defect analysis.
ETS
Carolina Metzler, Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel
2012 — conf
Why and How Controlling Power Consumption during Test: A Survey.
Asian Test Symposium
Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel
2011 C conf
A study of path delay variations in the presence of uncorrelated power and ground supply noise.
DDECS
Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
2011 — conf
Failure Analysis and Test Solutions for Low-Power SRAMs.
Asian Test Symposium
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine
2011 J jnl
Power Delivery for Multicore Systems.
IEEE Trans. Very Large Scale Integr. Syst.
Aida Todri, Malgorzata Marek-Sadowska
2011 — conf
Power-Aware Test Pattern Generation for At-Speed LOS Testing.
Asian Test Symposium
Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, Xiaoqing Wen
2011 J jnl
Reliability Analysis and Optimization of Power-Gated ICs.
IEEE Trans. Very Large Scale Integr. Syst.
Aida Todri, Malgorzata Marek-Sadowska
2009 — conf
A study of decoupling capacitor effectiveness in power and ground grid networks.
ISQED
Aida Todri, Malgorzata Marek-Sadowska, Francois Maire, Christophe Matheron
2009 A conf
Electromigration study of power-gated grids.
ISLPED
Aida Todri, Malgorzata Marek-Sadowska
2008 C conf
A study of reliability issues in clock distribution networks.
ICCD
Aida Todri, Malgorzata Marek-Sadowska
2008 A conf
Power supply noise aware workload assignment for multi-core systems.
ICCAD
Aida Todri, Malgorzata Marek-Sadowska, Joseph N. Kozhaya
2007 A conf
Analysis and optimization of power-gated ICs with multiple power gating configurations.
ICCAD
Aida Todri, Malgorzata Marek-Sadowska, Shih-Chieh Chang
2007 A conf
Electromigration and voltage drop aware power grid optimization for power gated ICs.
ISLPED
Aida Todri, Shih-Chieh Chang, Malgorzata Marek-Sadowska