Ahmad A. Al-Yamani

29 papers A* 2A 1B 1C 1Misc 5Journal 9Unranked 10
YearRankTypeTitle / Venue / Authors
2010 J jnl
Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test Patterns.
J. Electron. Test.
Ahmad A. Al-Yamani, Edward J. McCluskey
2009 — conf
Increasing memory yield in future technologies through innovative design.
ISQED
Costas Argyrides, Ahmad A. Al-Yamani, Carlos Arthur Lang Lisbôa, Luigi Carro, Dhiraj K. Pradhan
2009 J jnl
Reconfigurable broadcast scan compression using relaxation-based test vector decomposition.
IET Comput. Digit. Tech.
Aiman H. El-Maleh, Mustafa Imran Ali, Ahmad A. Al-Yamani
2008 J jnl
Comparative study of centralised and distributed compatibility-based test data compression.
IET Comput. Digit. Tech.
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
2007 J jnl
A Defect Tolerance Scheme for Nanotechnology Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap.
Ahmad A. Al-Yamani, S. Ramsundar, Dhiraj K. Pradhan
2007 — conf
A Reconfigurable Broadcast Scan Compression Scheme Using Relaxation Based Test Vector Decompos.
ATS
Aiman H. El-Maleh, Mustafa Imran Ali, Ahmad A. Al-Yamani
2007 — conf
Defect Tolerance in Nanotechnology Switches Using a Greedy Reconfiguration Algorithm.
ISQED
S. Ramsundar, Ahmad A. Al-Yamani, Dhiraj K. Pradhan
2007 J jnl
Energy-delay efficient test.
IET Comput. Digit. Tech.
Ahmad A. Al-Yamani
2007 — conf
High defect tolerant low cost memory chips.
SoCC
Costas Argyrides, Ahmad A. Al-Yamani, Dhiraj K. Pradhan
2007 J jnl
Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda
2007 — conf
Systematic Scan Reconfiguration.
ASP-DAC
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
2006 A* conf
DFT for controlled-impedance I/O buffers.
DAC
Ahmad A. Al-Yamani
2005 — conf
BIST-Guided ATPG.
ISQED
Ahmad A. Al-Yamani, Edward J. McCluskey
2005 Misc conf
Effective TARO Pattern Generation.
VTS
Intaik Park, Ahmad A. Al-Yamani, Edward J. McCluskey
2005 J jnl
Optimized reseeding by seed ordering and encoding.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey
2005 Misc conf
Segmented Addressable Scan Architecture.
VTS
Ahmad A. Al-Yamani, Erik Chmelar, Mikhail Grinchuck
2005 — conf
Should Illinois-Scan Based Architectures be Centralized or Distributed?
DFT
Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
2005 J jnl
Test chip experimental results on high-level structural test.
ACM Trans. Design Autom. Electr. Syst.
Ahmad A. Al-Yamani, Edward J. McCluskey
2004 Misc conf
ELF-Murphy Data on Defects and Test Sets.
VTS
Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra
2004 — conf
Test quality for high level structural test.
HLDVT
Ahmad A. Al-Yamani, Edward J. McCluskey
2003 Misc conf
Bist Reseeding with very few Seeds.
VTS
Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey
2003 Misc conf
Built-In Reseeding for Serial Bist.
VTS
Ahmad A. Al-Yamani, Edward J. McCluskey
2003 A conf
Parallel Tabu Search in a Heterogeneous Environment.
IPDPS
Ahmad A. Al-Yamani, Sadiq M. Sait, Hassan R. Barada, Habib Youssef
2003 A* conf
Seed encoding with LFSRs and cellular automata.
DAC
Ahmad A. Al-Yamani, Edward J. McCluskey
2002 B conf
HPTS: heterogeneous parallel tabu search for VLSI placement.
IEEE Congress on Evolutionary Computation
Ahmad A. Al-Yamani, Sadiq M. Sait, Hassan R. Barada
2002 J jnl
Parallelizing Tabu Search on a Cluster of Heterogeneous Workstations.
J. Heuristics
Ahmad A. Al-Yamani, Sadiq M. Sait, Habib Youssef, Hassan R. Barada
2002 — conf
Testing Digital Circuits with Constraints.
DFT
Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey
2001 — conf
Performance Evaluation of Checksum-Based ABFT.
DFT
Ahmad A. Al-Yamani, Nahmsuk Oh, Edward J. McCluskey
2000 C conf
A parallel tabu search algorithm for VLSI standard-cell placement.
ISCAS
Sadiq M. Sait, Habib Youssef, Hassan R. Barada, Ahmad A. Al-Yamani