Adelmo Ortiz-Conde

13 papers Journal 13
YearRankTypeTitle / Venue / Authors
2017 J jnl
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Andrea Sucre-González, Fabián Zárate-Rincón, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. García-Sánchez
2015 J jnl
A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction.
Microelectron. Reliab.
Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Juan Muci, Andrea Sucre-González, Juin J. Liou
2013 J jnl
Revisiting MOSFET threshold voltage extraction methods.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Alberto Terán Barrios, Juin J. Liou, Ching-Sung Ho
2011 J jnl
An explicit multi-exponential model for semiconductor junctions with series and shunt resistances.
Microelectron. Reliab.
Denise C. Lugo Muñoz, Juan Muci, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Michelly de Souza, Marcelo Antonio Pavanello
2010 J jnl
Integration-based approach to evaluate the sub-threshold slope of MOSFETs.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Ching-Sung Ho
2009 J jnl
Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Denise C. Lugo Muñoz, Álvaro D. Latorre Rey, Ching-Sung Ho, Juin J. Liou
2006 J jnl
Comments on "A sinh Resistor and Its Application to tanh Linearization".
IEEE J. Solid State Circuits
Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Jesús Finol, Ramón Salazar, Javier Salce
2006 J jnl
Understanding threshold voltage in undoped-body MOSFETs: An appraisal of various criteria.
Microelectron. Reliab.
Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Juan Muci
2002 J jnl
A review of recent MOSFET threshold voltage extraction methods.
Microelectron. Reliab.
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue
2002 J jnl
Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Xiaofang Gao, Juin J. Liou, Joe Bernier, Gregg D. Croft, Adelmo Ortiz-Conde
2002 J jnl
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs.
Microelectron. Reliab.
Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, Ching-Sung Ho
2002 J jnl
Quasi-three-dimensional spice-based simulation of the transient behavior, including plasma spread, of thyristors and over-voltage protectors.
Microelectron. Reliab.
Rodolfo Quintero, Antonio Cerdeira, Adelmo Ortiz-Conde
2001 J jnl
Determination of trap cross-section in a-Si: H p-i-n diodes parameters using simulation and parameter extraction.
Microelectron. Reliab.
Magali Estrada, Antonio Cerdeira, Adelmo Ortiz-Conde, Francisco J. García-Sánchez