Adam Cron

14 papers A* 1A 3B 1Misc 1Journal 7Unranked 1
YearRankTypeTitle / Venue / Authors
2025 J jnl
POCA: First Power-on Chip Authentication and Key Exchange for Secure Provisioning in System-on-Chip.
IEEE Trans. Very Large Scale Integr. Syst.
Md Sami Ul Islam Sami, Amit Mazumder Shuvo, Fahim Rahman, Adam Cron, Dale R. Donchin, Mike Borza, Farimah Farahmandi, Mark Tehranipoor
2023 Misc conf
CAPEC: A Cellular Automata Guided FSM-based IP Authentication Scheme.
VTS
Mridha Md Mashahedur Rahman, M. Sazadur Rahman, Rasheed Kibria, Mike Borza, Bandy Reddy, Adam Cron, Fahim Rahman, Mark Tehranipoor, Farimah Farahmandi
2022 J jnl
Applying IEEE Test Standards to Multidie Designs.
IEEE Des. Test
Teresa McLaurin, Adam Cron
2022 J jnl
Guest Editors' Introduction: Special Issue on Design and Test of Multidie Packages.
IEEE Des. Test
Adam Cron, Hailong Jiao, Erik Jan Marinissen
2022 J jnl
Quantifiable Assurance: From IPs to Platforms.
CoRR
Bulbul Ahmed, Md Kawser Bepary, Nitin Pundir, Mike Borza, Oleg Raikhman, Amit Garg, Dale R. Donchin, Adam Cron, Mohamed Abdel-Moneum, Farimah Farahmandi, Fahim Rahman, Mark Tehranipoor
2021 J jnl
IEEE Standard 1838 Is on the Move.
Computer
Adam Cron, Erik Jan Marinissen
2021 A* conf
Invited: End-to-End Secure SoC Lifecycle Management.
DAC
Md Sami Ul Islam Sami, Fahim Rahman, Farimah Farahmandi, Adam Cron, Mike Borza, Mark Tehranipoor
2021 — conf
POCA: First Power-on Chip Authentication in Untrusted Foundry and Assembly.
HOST
Md Sami Ul Islam Sami, Fahim Rahman, Adam Cron, Dale R. Donchin, Mike Borza, Farimah Farahmandi, Mark Tehranipoor
2021 J jnl
Quantifiable Assurance: From IPs to Platforms.
IACR Cryptol. ePrint Arch.
Bulbul Ahmed, Md Kawser Bepary, Nitin Pundir, Mike Borza, Oleg Raikhman, Amit Garg, Dale R. Donchin, Adam Cron, Mohamed A. Abdelmoneum, Farimah Farahmandi, Fahim Rahman, Mark Tehranipoor
2018 B conf
IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers.
ETS
Yu Li, Ming Shao, Hailong Jiao, Adam Cron, Sandeep Bhatia, Erik Jan Marinissen
2006 A conf
Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test.
ITC
Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg
2004 A conf
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6.
DATE
Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
1997 A conf
IEEE P1149.4-Almost a Standard.
ITC
Adam Cron
1996 J jnl
A D&T Special Report: P1149.4 Mixed-Signal Test Bus.
IEEE Des. Test Comput.
Adam Cron