| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2006 | J | jnl |
J. Electron. Test.
|
| 2006 | J | jnl |
IEEE Des. Test Comput.
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2004 | A | conf |
ITC
|
| 2004 | Misc | conf |
VTS
|
| 2004 | A | conf |
ITC
|
| 2003 | — | conf |
ASAP
|
| 2003 | A | conf |
ICCAD
|
| 2003 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | Misc | conf |
VTS
|
| 2001 | A | conf |
ITC
|